Characterization of high-resistivity poly-CdZnTe thick films grown by thermal evaporation method

  • K. H. Kim*
  • , Y. H. Na
  • , Y. J. Park
  • , T. R. Jung
  • , S. U. Kim
  • , J. K. Hong
    • *Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    38 Citations (Scopus)

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    Keyphrases

    Engineering

    Material Science