Characterization of interdigital stub with defected ground structure

Seongmin Pyo; Jung Woo Baik; Dong Hyo Lee; Young Sik Kim

doi:10.1002/mop.24331

Characterization of interdigital stub with defected ground structure

Seongmin Pyo, Jung Woo Baik, Dong Hyo Lee, Young Sik Kim

* Honorary professors

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

A new scheme with an interdigital line and a defected ground structure for dual-band operation is dealt with in this letter. The proposed structure is analyzed using a series L-C resonator model added a parasitic shunt capacitance. The nonlinear phase of this structure is dependent on the dumbbell size of the defected ground. This proposed scheme is applicable for a short-ended stub circuit and a dual pass-band filter at the centre frequencies of 860 and 1810 MHz.

Original language	English
Pages (from-to)	1353-1356
Number of pages	4
Journal	Microwave and Optical Technology Letters
Volume	51
Issue number	5
DOIs	https://doi.org/10.1002/mop.24331
Publication status	Published - 2009 May

Keywords

Defected ground structure
Dual-band
Filter

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1002/mop.24331

Cite this

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Characterization of interdigital stub with defected ground structure

Abstract

Keywords

ASJC Scopus subject areas

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