Characterization of polyaniline thin films prepared by cluster beam deposition methods

H. Lim; B. J. Kim; J. H. Choi

doi:10.1016/S0379-6779(02)00568-4

Characterization of polyaniline thin films prepared by cluster beam deposition methods

H. Lim, B. J. Kim, J. H. Choi

Department of Chemistry

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

Polyaniline (PANI) films have been prepared by applying neutral and ionized cluster beam deposition (NCBD and ICBD) methods. Spectroscopic studies demonstrate that the dominant chemical structure of the as-deposited PANI films corresponds to the reduced leucoemeraldine state in comparison to the initial emeraldine state. Atomic force microscopy (AFM) measurements show that the cluster beam deposition method is effective in producing uniform polymeric films consisting of the reduced PANI species.

Original language	English
Pages (from-to)	81-82
Number of pages	2
Journal	Synthetic Metals
Volume	135-136
DOIs	https://doi.org/10.1016/S0379-6779(02)00568-4
Publication status	Published - 2003 Apr 4

Keywords

Atomic force microscopy
Cluster beam deposition
Polyaniline thin film
UV-visible absorption spectroscopy
X-ray photoelectron spectroscopy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry

Access to Document

10.1016/S0379-6779(02)00568-4

Cite this

@article{5078d8d40e984dfba68b67e4e7b4d879,

title = "Characterization of polyaniline thin films prepared by cluster beam deposition methods",

abstract = "Polyaniline (PANI) films have been prepared by applying neutral and ionized cluster beam deposition (NCBD and ICBD) methods. Spectroscopic studies demonstrate that the dominant chemical structure of the as-deposited PANI films corresponds to the reduced leucoemeraldine state in comparison to the initial emeraldine state. Atomic force microscopy (AFM) measurements show that the cluster beam deposition method is effective in producing uniform polymeric films consisting of the reduced PANI species.",

keywords = "Atomic force microscopy, Cluster beam deposition, Polyaniline thin film, UV-visible absorption spectroscopy, X-ray photoelectron spectroscopy",

author = "H. Lim and Kim, {B. J.} and Choi, {J. H.}",

year = "2003",

month = apr,

day = "4",

doi = "10.1016/S0379-6779(02)00568-4",

language = "English",

volume = "135-136",

pages = "81--82",

journal = "Synthetic Metals",

issn = "0379-6779",

publisher = "Elsevier BV",

}

TY - JOUR

T1 - Characterization of polyaniline thin films prepared by cluster beam deposition methods

AU - Lim, H.

AU - Kim, B. J.

AU - Choi, J. H.

PY - 2003/4/4

Y1 - 2003/4/4

N2 - Polyaniline (PANI) films have been prepared by applying neutral and ionized cluster beam deposition (NCBD and ICBD) methods. Spectroscopic studies demonstrate that the dominant chemical structure of the as-deposited PANI films corresponds to the reduced leucoemeraldine state in comparison to the initial emeraldine state. Atomic force microscopy (AFM) measurements show that the cluster beam deposition method is effective in producing uniform polymeric films consisting of the reduced PANI species.

AB - Polyaniline (PANI) films have been prepared by applying neutral and ionized cluster beam deposition (NCBD and ICBD) methods. Spectroscopic studies demonstrate that the dominant chemical structure of the as-deposited PANI films corresponds to the reduced leucoemeraldine state in comparison to the initial emeraldine state. Atomic force microscopy (AFM) measurements show that the cluster beam deposition method is effective in producing uniform polymeric films consisting of the reduced PANI species.

KW - Atomic force microscopy

KW - Cluster beam deposition

KW - Polyaniline thin film

KW - UV-visible absorption spectroscopy

KW - X-ray photoelectron spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=23044441536&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=23044441536&partnerID=8YFLogxK

U2 - 10.1016/S0379-6779(02)00568-4

DO - 10.1016/S0379-6779(02)00568-4

M3 - Article

AN - SCOPUS:23044441536

SN - 0379-6779

VL - 135-136

SP - 81

EP - 82

JO - Synthetic Metals

JF - Synthetic Metals

ER -

Characterization of polyaniline thin films prepared by cluster beam deposition methods

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this