Abstract
Polyaniline (PANI) films have been prepared by applying neutral and ionized cluster beam deposition (NCBD and ICBD) methods. Spectroscopic studies demonstrate that the dominant chemical structure of the as-deposited PANI films corresponds to the reduced leucoemeraldine state in comparison to the initial emeraldine state. Atomic force microscopy (AFM) measurements show that the cluster beam deposition method is effective in producing uniform polymeric films consisting of the reduced PANI species.
Original language | English |
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Pages (from-to) | 81-82 |
Number of pages | 2 |
Journal | Synthetic Metals |
Volume | 135-136 |
DOIs | |
Publication status | Published - 2003 Apr 4 |
Keywords
- Atomic force microscopy
- Cluster beam deposition
- Polyaniline thin film
- UV-visible absorption spectroscopy
- X-ray photoelectron spectroscopy
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys
- Materials Chemistry