Characterization of thin liquid films using molecular dynamics simulation

Jaeil Lee; Seungho Park; Ohmyoung Kwon; Young Ki Choi; Joon Sik Lee

doi:10.1007/BF02985141

Characterization of thin liquid films using molecular dynamics simulation

Jaeil Lee
, Seungho Park^*
, Ohmyoung Kwon
, Young Ki Choi
, Joon Sik Lee

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

Various characteristics of a thin liquid film in its vapor-phase are investigated using the molecular dynamics technique. Local distributions of the temperature, density, normal and tangential pressure components, and stress are calculated for various film thicknesses and temperature levels. Distributions of local stresses change considerably with respect to film thicknesses, and interfacial regions on both sides of the film start to overlap with each other as the film becomes thinner. Integration of the local stresses, i.e., the surface tension, however7 does not vary much regardless of the interfacial overlap. The minimum thickness of a liquid film before rupturing is estimated with respect to the calculation domain sizes and is compared with a simple theoretical relation.

Original language	English
Pages (from-to)	1477-1484
Number of pages	8
Journal	KSME International Journal
Volume	16
Issue number	11
DOIs	https://doi.org/10.1007/BF02985141
Publication status	Published - 2002 Nov
Externally published	Yes

Bibliographical note

Funding Information:
The authorsg ratefullya cknowledgefi nancial supportfr omthe Micro ThermalS ystemR esearch Center sponsoredb y the Korea Science and EngineeringF oundationa nd S. H. Park has been partially supported from the Basic Research Program of the Korea Science & Engineering Foundationu nder granNto . 1999-1-304-002-5.

Keywords

Interfacial Overlap
Molecular Dynamics
Surface Tension
Thin Liquid Film

ASJC Scopus subject areas

Mechanical Engineering

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10.1007/BF02985141

Cite this

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title = "Characterization of thin liquid films using molecular dynamics simulation",

abstract = "Various characteristics of a thin liquid film in its vapor-phase are investigated using the molecular dynamics technique. Local distributions of the temperature, density, normal and tangential pressure components, and stress are calculated for various film thicknesses and temperature levels. Distributions of local stresses change considerably with respect to film thicknesses, and interfacial regions on both sides of the film start to overlap with each other as the film becomes thinner. Integration of the local stresses, i.e., the surface tension, however7 does not vary much regardless of the interfacial overlap. The minimum thickness of a liquid film before rupturing is estimated with respect to the calculation domain sizes and is compared with a simple theoretical relation.",

keywords = "Interfacial Overlap, Molecular Dynamics, Surface Tension, Thin Liquid Film",

author = "Jaeil Lee and Seungho Park and Ohmyoung Kwon and Choi, \{Young Ki\} and Lee, \{Joon Sik\}",

note = "Funding Information: The authorsg ratefullya cknowledgefi nancial supportfr omthe Micro ThermalS ystemR esearch Center sponsoredb y the Korea Science and EngineeringF oundationa nd S. H. Park has been partially supported from the Basic Research Program of the Korea Science \& Engineering Foundationu nder granNto . 1999-1-304-002-5.",

year = "2002",

month = nov,

doi = "10.1007/BF02985141",

language = "English",

volume = "16",

pages = "1477--1484",

journal = "KSME International Journal",

issn = "1226-4865",

publisher = "Korean Society of Mechanical Engineers",

number = "11",

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TY - JOUR

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AU - Lee, Jaeil

AU - Park, Seungho

AU - Kwon, Ohmyoung

AU - Choi, Young Ki

AU - Lee, Joon Sik

N1 - Funding Information: The authorsg ratefullya cknowledgefi nancial supportfr omthe Micro ThermalS ystemR esearch Center sponsoredb y the Korea Science and EngineeringF oundationa nd S. H. Park has been partially supported from the Basic Research Program of the Korea Science & Engineering Foundationu nder granNto . 1999-1-304-002-5.

PY - 2002/11

Y1 - 2002/11

N2 - Various characteristics of a thin liquid film in its vapor-phase are investigated using the molecular dynamics technique. Local distributions of the temperature, density, normal and tangential pressure components, and stress are calculated for various film thicknesses and temperature levels. Distributions of local stresses change considerably with respect to film thicknesses, and interfacial regions on both sides of the film start to overlap with each other as the film becomes thinner. Integration of the local stresses, i.e., the surface tension, however7 does not vary much regardless of the interfacial overlap. The minimum thickness of a liquid film before rupturing is estimated with respect to the calculation domain sizes and is compared with a simple theoretical relation.

AB - Various characteristics of a thin liquid film in its vapor-phase are investigated using the molecular dynamics technique. Local distributions of the temperature, density, normal and tangential pressure components, and stress are calculated for various film thicknesses and temperature levels. Distributions of local stresses change considerably with respect to film thicknesses, and interfacial regions on both sides of the film start to overlap with each other as the film becomes thinner. Integration of the local stresses, i.e., the surface tension, however7 does not vary much regardless of the interfacial overlap. The minimum thickness of a liquid film before rupturing is estimated with respect to the calculation domain sizes and is compared with a simple theoretical relation.

KW - Interfacial Overlap

KW - Molecular Dynamics

KW - Surface Tension

KW - Thin Liquid Film

UR - https://www.scopus.com/pages/publications/0038179073

U2 - 10.1007/BF02985141

DO - 10.1007/BF02985141

M3 - Article

AN - SCOPUS:0038179073

SN - 1226-4865

VL - 16

SP - 1477

EP - 1484

JO - KSME International Journal

JF - KSME International Journal

IS - 11

ER -

Characterization of thin liquid films using molecular dynamics simulation

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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