Characterizaton of tetracene-based electroluminescent devices produced by cluster beam deposition methods

Eun Ah You; Young Geun Ha; Young Sang Choi; Jong Ho Choi

doi:10.1016/j.synthmet.2005.07.281

Characterizaton of tetracene-based electroluminescent devices produced by cluster beam deposition methods

Eun Ah You, Young Geun Ha, Young Sang Choi, Jong Ho Choi

Department of Chemistry

Research output: Contribution to journal › Article › peer-review

19 Citations (Scopus)

Abstract

We have fabricated and characterized heterojunction electroluminescent devices with the structure of ITO-coated glass/tetracene/(DCM-doped)Alq ₃/Li:Al. The organic thin films of tetracene, Alq₃, and dye dopant DCM were deposited by applying the cluster beam deposition (CBD) methods. X-ray diffraction (XRD) and atomic force microscopy (AFM) measurements show that the flat and smooth thin tetracene films are close to a highly ordered, single crystal. Photoluminescence (PL), electroluminescence (EL) and device characteristics such as current density-voltage (J - V), EL intensity-voltage (L - V), and external quantum efficiency-current (EQE-I) were examined for undoped and DCM-doped devices.

Original language	English
Pages (from-to)	209-212
Number of pages	4
Journal	Synthetic Metals
Volume	153
Issue number	1-3
DOIs	https://doi.org/10.1016/j.synthmet.2005.07.281
Publication status	Published - 2005 Sept 21

Keywords

Alq
Cluster beam deposition
DCM
OLED
Tetracene

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Metals and Alloys
Materials Chemistry

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10.1016/j.synthmet.2005.07.281

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title = "Characterizaton of tetracene-based electroluminescent devices produced by cluster beam deposition methods",

abstract = "We have fabricated and characterized heterojunction electroluminescent devices with the structure of ITO-coated glass/tetracene/(DCM-doped)Alq 3/Li:Al. The organic thin films of tetracene, Alq3, and dye dopant DCM were deposited by applying the cluster beam deposition (CBD) methods. X-ray diffraction (XRD) and atomic force microscopy (AFM) measurements show that the flat and smooth thin tetracene films are close to a highly ordered, single crystal. Photoluminescence (PL), electroluminescence (EL) and device characteristics such as current density-voltage (J - V), EL intensity-voltage (L - V), and external quantum efficiency-current (EQE-I) were examined for undoped and DCM-doped devices.",

keywords = "Alq, Cluster beam deposition, DCM, OLED, Tetracene",

author = "You, {Eun Ah} and Ha, {Young Geun} and Choi, {Young Sang} and Choi, {Jong Ho}",

year = "2005",

month = sep,

day = "21",

doi = "10.1016/j.synthmet.2005.07.281",

language = "English",

volume = "153",

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journal = "Synthetic Metals",

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publisher = "Elsevier BV",

number = "1-3",

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TY - JOUR

T1 - Characterizaton of tetracene-based electroluminescent devices produced by cluster beam deposition methods

AU - You, Eun Ah

AU - Ha, Young Geun

AU - Choi, Young Sang

AU - Choi, Jong Ho

PY - 2005/9/21

Y1 - 2005/9/21

N2 - We have fabricated and characterized heterojunction electroluminescent devices with the structure of ITO-coated glass/tetracene/(DCM-doped)Alq 3/Li:Al. The organic thin films of tetracene, Alq3, and dye dopant DCM were deposited by applying the cluster beam deposition (CBD) methods. X-ray diffraction (XRD) and atomic force microscopy (AFM) measurements show that the flat and smooth thin tetracene films are close to a highly ordered, single crystal. Photoluminescence (PL), electroluminescence (EL) and device characteristics such as current density-voltage (J - V), EL intensity-voltage (L - V), and external quantum efficiency-current (EQE-I) were examined for undoped and DCM-doped devices.

AB - We have fabricated and characterized heterojunction electroluminescent devices with the structure of ITO-coated glass/tetracene/(DCM-doped)Alq 3/Li:Al. The organic thin films of tetracene, Alq3, and dye dopant DCM were deposited by applying the cluster beam deposition (CBD) methods. X-ray diffraction (XRD) and atomic force microscopy (AFM) measurements show that the flat and smooth thin tetracene films are close to a highly ordered, single crystal. Photoluminescence (PL), electroluminescence (EL) and device characteristics such as current density-voltage (J - V), EL intensity-voltage (L - V), and external quantum efficiency-current (EQE-I) were examined for undoped and DCM-doped devices.

KW - Alq

KW - Cluster beam deposition

KW - DCM

KW - OLED

KW - Tetracene

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DO - 10.1016/j.synthmet.2005.07.281

M3 - Article

AN - SCOPUS:24644493403

SN - 0379-6779

VL - 153

SP - 209

EP - 212

JO - Synthetic Metals

JF - Synthetic Metals

IS - 1-3

ER -

Characterizaton of tetracene-based electroluminescent devices produced by cluster beam deposition methods

Abstract

Keywords

ASJC Scopus subject areas

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