Combined study of X-ray reflectivity and atomic force microscopy on a surface-grafted phospholipid monolayer on a solid

Kwangmeyung Kim, Youngro Byun, Chulhee Kim, Tae Chul Kim, Do Young Noh, Kwanwoo Shin

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)


We investigated the detailed structure of a surface-grafted phospholipid monolayer, which was polymerized in situ onto a methacryloyl-silanized solid surface. By the combined study of X-ray reflectivity and atomic force microscopy, the in situ polymerization step of the lipid molecules are sufficiently detailed to reveal the molecular structure of lipid molecules before and after in situ polymerization. From the data of the X-ray reflectivity, we confirmed that the in situ polymerization process produces a flat lipid monolayer structure and that the lipid monolayer is substantially grafted on a silanized surface by chemical bonding. After the polymerization and washing processes, the thickness of the head group was 9 Å and the thickness of the tail group was 21 Å. The surface morphology of the polymerized phospholipid monolayer obtained by the measurements of atomic force microscopy was consistent with the results of the X-ray reflectivity. The cross-sectional analysis shows that the surface coverage of lipid molecules, which are chemically grafted onto a silanized surface, is approximately 89%.

Original languageEnglish
Pages (from-to)107-113
Number of pages7
JournalJournal of Colloid and Interface Science
Issue number1
Publication statusPublished - 2005 Apr 1
Externally publishedYes

Bibliographical note

Funding Information:
This work was supported by the Korea Research Foundation (KRF-2002-042-D20046).

Copyright 2008 Elsevier B.V., All rights reserved.


  • Atomic force microscopy
  • In situ polymerization
  • Phospholipid monolayer
  • X-ray reflectivity

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • Surfaces, Coatings and Films
  • Colloid and Surface Chemistry


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