Keyphrases
Silica
100%
Metal Oxide Semiconductor
100%
Characterization Techniques
100%
4H-SiC
100%
Semiconductor Diodes
100%
Interface State Density
100%
Density Characterization
100%
Surface State Density
66%
HiLo
66%
UV Light
33%
Metal-oxide-semiconductor Capacitor (MOSCAP)
33%
Trap Density
33%
Quasi-static
33%
Terman
33%
Engineering
Metal Oxide Semiconductor
100%
Interface State
100%
Surface State
100%
Characterization Method
100%
Silicon Dioxide
100%
Chemistry
Metal Oxide
100%
Surface State
100%
Density of Interface States
100%
Trap Density Measurement
50%
Interface State
50%
Material Science
Density
100%
Oxide Semiconductor
100%
Metal Oxide
100%
Capacitor
20%
Surface (Surface Science)
20%
Physics
Metal Oxide Semiconductor
100%
Semiconductor Diodes
100%
Ultraviolet Radiation
50%
Earth and Planetary Sciences
Metal Oxide Semiconductor
100%
Semiconductor Diodes
100%
Ultraviolet Radiation
50%