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Comprehensive Understanding of Fatigue, Breakdown, and Recovery Mechanism by Thickness Scaling in Hf0.5Zr0.5O2/Ge MF(I)S Capacitors for Low Writing Voltages

  • Jai Youn Jeong
  • , Kyeol Ko
  • , Changhwan Shin*
  • , Jae Hoon Han*
    • *Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

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