Concentration of extended defects in CdZnTe single crystals: Effects of cooling rate after growth

L. Xu; W. Jie; A. E. Bolotnikov; U. N. Roy; J. Stein; A. Hossain; G. S. Camarda; K. H. Kim; G. Yang; R. Gul; Y. Cui; Y. Xu; T. Wang; G. Zha; R. B. James

doi:10.1016/j.jcrysgro.2012.06.024

Concentration of extended defects in CdZnTe single crystals: Effects of cooling rate after growth

L. Xu, W. Jie, A. E. Bolotnikov, U. N. Roy, J. Stein, A. Hossain, G. S. Camarda, K. H. Kim, G. Yang, R. Gul, Y. Cui, Y. Xu, T. Wang, G. Zha, R. B. James

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

We analyzed two CZT crystals cut from as-grown CdZnTe (CZT) ingots, the only difference between them being the rate of cooling after the crystal growth process. Using White Beam X-ray Diffraction Topography (WBXDT) and Infrared (IR) Transmission Microscopy, we identified and quantified the extended defects, e.g., Te inclusions, dislocations, and sub-grain boundaries. The effects of cooling rate on the size distribution and concentration were studied. The WBXDT and IR images of the fast-cooled crystal revealed very high density of dislocations and sub-grain boundaries, crisscrossing throughout its entire volume, extending from deep inside almost to the surface. In addition, IR analyses showed that the concentration of Te inclusions in the fast-cooled crystal (10 ⁶ cm ^-3) was higher than that in the slow-cooled one (10 ⁵ cm ^-3). For the latter, both the WBXDT and the IR images were bright and clear with low concentration of defects. We concluded that slow cooling rate can greatly reduce the number of Te inclusions and inclusion-decorated extended defects in as-grown CZT ingots.

Original language	English
Pages (from-to)	84-87
Number of pages	4
Journal	Journal of Crystal Growth
Volume	355
Issue number	1
DOIs	https://doi.org/10.1016/j.jcrysgro.2012.06.024
Publication status	Published - 2012 Sept 15
Externally published	Yes

Bibliographical note

Funding Information:
This work was supported by the Special Fund of National Key Scientific Instruments and Equipments Development ( 2011YQ040082 ), the National 973 Project of China ( 2011CB610400 ), the 111 Project of China ( B08040 ), the National Natural Science Foundation of China ( NNSFC-50902114 ), the Foundation for Fundamental Research of Northwestern Polytechnical University, the Doctorate Foundation of Northwestern Polytechnical University ( CX201102 ), Ministry of Education Fund for Doctoral Students Newcomer Awards of China, and the U.S. Department of Energy, Office of Nonproliferation Research and Development (NA-22). Lingyan Xu is grateful for the financial support from the China Scholarship Council under the State Scholarship Fund to pursue this study at Dr. Ralph B. James' Advanced Radiation Detection Group at Brookhaven National Laboratory (BNL). Specially, the authors sincerely acknowledge Avril Woodhead for her assistance with preparation of this paper.

Keywords

A1. Extended defect
A1. Sub-grain boundary
A1. Te inclusion
A2. Cooling rate
A2. Crystal growth
B2. CdZnTe

ASJC Scopus subject areas

Condensed Matter Physics
Inorganic Chemistry
Materials Chemistry

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10.1016/j.jcrysgro.2012.06.024

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@article{21aebf0cb80044008e8980a27d3e5f02,

title = "Concentration of extended defects in CdZnTe single crystals: Effects of cooling rate after growth",

abstract = "We analyzed two CZT crystals cut from as-grown CdZnTe (CZT) ingots, the only difference between them being the rate of cooling after the crystal growth process. Using White Beam X-ray Diffraction Topography (WBXDT) and Infrared (IR) Transmission Microscopy, we identified and quantified the extended defects, e.g., Te inclusions, dislocations, and sub-grain boundaries. The effects of cooling rate on the size distribution and concentration were studied. The WBXDT and IR images of the fast-cooled crystal revealed very high density of dislocations and sub-grain boundaries, crisscrossing throughout its entire volume, extending from deep inside almost to the surface. In addition, IR analyses showed that the concentration of Te inclusions in the fast-cooled crystal (10 6 cm -3) was higher than that in the slow-cooled one (10 5 cm -3). For the latter, both the WBXDT and the IR images were bright and clear with low concentration of defects. We concluded that slow cooling rate can greatly reduce the number of Te inclusions and inclusion-decorated extended defects in as-grown CZT ingots.",

keywords = "A1. Extended defect, A1. Sub-grain boundary, A1. Te inclusion, A2. Cooling rate, A2. Crystal growth, B2. CdZnTe",

author = "L. Xu and W. Jie and Bolotnikov, {A. E.} and Roy, {U. N.} and J. Stein and A. Hossain and Camarda, {G. S.} and Kim, {K. H.} and G. Yang and R. Gul and Y. Cui and Y. Xu and T. Wang and G. Zha and James, {R. B.}",

note = "Funding Information: This work was supported by the Special Fund of National Key Scientific Instruments and Equipments Development ( 2011YQ040082 ), the National 973 Project of China ( 2011CB610400 ), the 111 Project of China ( B08040 ), the National Natural Science Foundation of China ( NNSFC-50902114 ), the Foundation for Fundamental Research of Northwestern Polytechnical University, the Doctorate Foundation of Northwestern Polytechnical University ( CX201102 ), Ministry of Education Fund for Doctoral Students Newcomer Awards of China, and the U.S. Department of Energy, Office of Nonproliferation Research and Development (NA-22). Lingyan Xu is grateful for the financial support from the China Scholarship Council under the State Scholarship Fund to pursue this study at Dr. Ralph B. James' Advanced Radiation Detection Group at Brookhaven National Laboratory (BNL). Specially, the authors sincerely acknowledge Avril Woodhead for her assistance with preparation of this paper.",

year = "2012",

month = sep,

day = "15",

doi = "10.1016/j.jcrysgro.2012.06.024",

language = "English",

volume = "355",

pages = "84--87",

journal = "Journal of Crystal Growth",

issn = "0022-0248",

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number = "1",

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TY - JOUR

T1 - Concentration of extended defects in CdZnTe single crystals

T2 - Effects of cooling rate after growth

AU - Xu, L.

AU - Jie, W.

AU - Bolotnikov, A. E.

AU - Roy, U. N.

AU - Stein, J.

AU - Hossain, A.

AU - Camarda, G. S.

AU - Kim, K. H.

AU - Yang, G.

AU - Gul, R.

AU - Cui, Y.

AU - Xu, Y.

AU - Wang, T.

AU - Zha, G.

AU - James, R. B.

N1 - Funding Information: This work was supported by the Special Fund of National Key Scientific Instruments and Equipments Development ( 2011YQ040082 ), the National 973 Project of China ( 2011CB610400 ), the 111 Project of China ( B08040 ), the National Natural Science Foundation of China ( NNSFC-50902114 ), the Foundation for Fundamental Research of Northwestern Polytechnical University, the Doctorate Foundation of Northwestern Polytechnical University ( CX201102 ), Ministry of Education Fund for Doctoral Students Newcomer Awards of China, and the U.S. Department of Energy, Office of Nonproliferation Research and Development (NA-22). Lingyan Xu is grateful for the financial support from the China Scholarship Council under the State Scholarship Fund to pursue this study at Dr. Ralph B. James' Advanced Radiation Detection Group at Brookhaven National Laboratory (BNL). Specially, the authors sincerely acknowledge Avril Woodhead for her assistance with preparation of this paper.

PY - 2012/9/15

Y1 - 2012/9/15

N2 - We analyzed two CZT crystals cut from as-grown CdZnTe (CZT) ingots, the only difference between them being the rate of cooling after the crystal growth process. Using White Beam X-ray Diffraction Topography (WBXDT) and Infrared (IR) Transmission Microscopy, we identified and quantified the extended defects, e.g., Te inclusions, dislocations, and sub-grain boundaries. The effects of cooling rate on the size distribution and concentration were studied. The WBXDT and IR images of the fast-cooled crystal revealed very high density of dislocations and sub-grain boundaries, crisscrossing throughout its entire volume, extending from deep inside almost to the surface. In addition, IR analyses showed that the concentration of Te inclusions in the fast-cooled crystal (10 6 cm -3) was higher than that in the slow-cooled one (10 5 cm -3). For the latter, both the WBXDT and the IR images were bright and clear with low concentration of defects. We concluded that slow cooling rate can greatly reduce the number of Te inclusions and inclusion-decorated extended defects in as-grown CZT ingots.

AB - We analyzed two CZT crystals cut from as-grown CdZnTe (CZT) ingots, the only difference between them being the rate of cooling after the crystal growth process. Using White Beam X-ray Diffraction Topography (WBXDT) and Infrared (IR) Transmission Microscopy, we identified and quantified the extended defects, e.g., Te inclusions, dislocations, and sub-grain boundaries. The effects of cooling rate on the size distribution and concentration were studied. The WBXDT and IR images of the fast-cooled crystal revealed very high density of dislocations and sub-grain boundaries, crisscrossing throughout its entire volume, extending from deep inside almost to the surface. In addition, IR analyses showed that the concentration of Te inclusions in the fast-cooled crystal (10 6 cm -3) was higher than that in the slow-cooled one (10 5 cm -3). For the latter, both the WBXDT and the IR images were bright and clear with low concentration of defects. We concluded that slow cooling rate can greatly reduce the number of Te inclusions and inclusion-decorated extended defects in as-grown CZT ingots.

KW - A1. Extended defect

KW - A1. Sub-grain boundary

KW - A1. Te inclusion

KW - A2. Cooling rate

KW - A2. Crystal growth

KW - B2. CdZnTe

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U2 - 10.1016/j.jcrysgro.2012.06.024

DO - 10.1016/j.jcrysgro.2012.06.024

M3 - Article

AN - SCOPUS:84864053720

SN - 0022-0248

VL - 355

SP - 84

EP - 87

JO - Journal of Crystal Growth

JF - Journal of Crystal Growth

IS - 1

ER -

Concentration of extended defects in CdZnTe single crystals: Effects of cooling rate after growth

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

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