TY - JOUR
T1 - Contact barriers in a single ZnO nanowire device
AU - Kim, Kanghyun
AU - Kang, Haeyong
AU - Kim, Hyeyoung
AU - Lee, Jong Soo
AU - Kim, Sangtae
AU - Kang, Woun
AU - Kim, Gyu Tae
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2009/2
Y1 - 2009/2
N2 - The contact potential between a single ZnO nanowire and Ti/Au contacts was estimated to be ∼30 meV by considering the Arrhenious plot of the two-probe resistance, the thermionic emission conduction, and the Fowler-Nordheim tunneling model. The net voltages applied to the contacts were calculated by subtracting the four-probe voltages from the two-probe voltages at the same currents. The activation energy of the four-probe resistance was about 2.4 mV which was 1/11th of that of the two-probe resistance. The Fowler-Nordheim plot clearly showed the crossover of the conduction mechanism from thermionic emission to tunneling regime as lowering the temperatures below T<100 K.
AB - The contact potential between a single ZnO nanowire and Ti/Au contacts was estimated to be ∼30 meV by considering the Arrhenious plot of the two-probe resistance, the thermionic emission conduction, and the Fowler-Nordheim tunneling model. The net voltages applied to the contacts were calculated by subtracting the four-probe voltages from the two-probe voltages at the same currents. The activation energy of the four-probe resistance was about 2.4 mV which was 1/11th of that of the two-probe resistance. The Fowler-Nordheim plot clearly showed the crossover of the conduction mechanism from thermionic emission to tunneling regime as lowering the temperatures below T<100 K.
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U2 - 10.1007/s00339-008-4787-5
DO - 10.1007/s00339-008-4787-5
M3 - Article
AN - SCOPUS:57249086531
SN - 0947-8396
VL - 94
SP - 253
EP - 256
JO - Applied Physics A: Materials Science and Processing
JF - Applied Physics A: Materials Science and Processing
IS - 2
ER -