Contrastive Regularization for Semi-Supervised Learning

  • Doyup Lee
  • , Sungwoong Kim
  • , Ildoo Kim
  • , Yeongjae Cheon
  • , Minsu Cho
  • , Wook Shin Han*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Consistency regularization on label predictions becomes a fundamental technique in semi-supervised learning, but it still requires a large number of training iterations for high performance. In this study, we analyze that the consistency regularization restricts the propagation of labeling information due to the exclusion of samples with unconfident pseudo-labels in the model updates. Then, we propose contrastive regularization to improve both efficiency and accuracy of the consistency regularization by well-clustered features of unlabeled data. In specific, after strongly augmented samples are assigned to clusters by their pseudolabels, our contrastive regularization updates the model so that the features with confident pseudo-labels aggregate the features in the same cluster, while pushing away features in different clusters. As a result, the information of confident pseudo-labels can be effectively propagated into more unlabeled samples during training by the well-clustered features. On benchmarks of semi-supervised learning tasks, our contrastive regularization improves the previous consistency-based methods and achieves state-ofthe-art results, especially with fewer training iterations. Our method also shows robust performance on open-set semi-supervised learning where unlabeled data includes out-of-distribution samples.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
PublisherIEEE Computer Society
Pages3910-3919
Number of pages10
ISBN (Electronic)9781665487399
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States
Duration: 2022 Jun 192022 Jun 24

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2022-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Country/TerritoryUnited States
CityNew Orleans
Period22/6/1922/6/24

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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