Abstract
Consistency regularization on label predictions becomes a fundamental technique in semi-supervised learning, but it still requires a large number of training iterations for high performance. In this study, we analyze that the consistency regularization restricts the propagation of labeling information due to the exclusion of samples with unconfident pseudo-labels in the model updates. Then, we propose contrastive regularization to improve both efficiency and accuracy of the consistency regularization by well-clustered features of unlabeled data. In specific, after strongly augmented samples are assigned to clusters by their pseudolabels, our contrastive regularization updates the model so that the features with confident pseudo-labels aggregate the features in the same cluster, while pushing away features in different clusters. As a result, the information of confident pseudo-labels can be effectively propagated into more unlabeled samples during training by the well-clustered features. On benchmarks of semi-supervised learning tasks, our contrastive regularization improves the previous consistency-based methods and achieves state-ofthe-art results, especially with fewer training iterations. Our method also shows robust performance on open-set semi-supervised learning where unlabeled data includes out-of-distribution samples.
| Original language | English |
|---|---|
| Title of host publication | Proceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 |
| Publisher | IEEE Computer Society |
| Pages | 3910-3919 |
| Number of pages | 10 |
| ISBN (Electronic) | 9781665487399 |
| DOIs | |
| Publication status | Published - 2022 |
| Externally published | Yes |
| Event | 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States Duration: 2022 Jun 19 → 2022 Jun 24 |
Publication series
| Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
|---|---|
| Volume | 2022-June |
| ISSN (Print) | 2160-7508 |
| ISSN (Electronic) | 2160-7516 |
Conference
| Conference | 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 |
|---|---|
| Country/Territory | United States |
| City | New Orleans |
| Period | 22/6/19 → 22/6/24 |
Bibliographical note
Publisher Copyright:© 2022 IEEE.
ASJC Scopus subject areas
- Computer Vision and Pattern Recognition
- Electrical and Electronic Engineering
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