Control chart pattern recognition of manufacturing process using wavelet feature-based artificial neural networks

Jun Seok Kim; Sang Hoon Park; Cheong Sool Park; Hyo Heon Ko; Sung Shick Kim; Jun Geol Baek

doi:10.1166/asl.2012.3904

Control chart pattern recognition of manufacturing process using wavelet feature-based artificial neural networks

Jun Seok Kim, Sang Hoon Park, Cheong Sool Park, Hyo Heon Ko, Sung Shick Kim, Jun Geol Baek

School of Industrial Management Engineering

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

Control chart pattern recognition is one of the most important tools in the identification of process problems in modern manufacturing industries. Abnormal patterns including systematic, cyclic, drift, and shift could be involved with certain assignable causes. Conventional control charts could not inherently recognize these patterns. In this paper, multi-resolution wavelet analysis is used to extract features. A self-organizing map then generates cluster vectors with wavelet coefficients. Using these features, a back-propagation network classifies unnatural patterns. The performance evaluation result is better than those of other competitive methods.

Original language	English
Pages (from-to)	863-866
Number of pages	4
Journal	Advanced Science Letters
Volume	13
DOIs	https://doi.org/10.1166/asl.2012.3904
Publication status	Published - 2012 Jun

Keywords

Artificial neural network
Control charts
Feature extraction
Multi-class classification
Pattern recognition
Wavelet analysis

ASJC Scopus subject areas

Computer Science(all)
Health(social science)
Mathematics(all)
Education
Environmental Science(all)
Engineering(all)
Energy(all)

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10.1166/asl.2012.3904

Cite this

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title = "Control chart pattern recognition of manufacturing process using wavelet feature-based artificial neural networks",

abstract = "Control chart pattern recognition is one of the most important tools in the identification of process problems in modern manufacturing industries. Abnormal patterns including systematic, cyclic, drift, and shift could be involved with certain assignable causes. Conventional control charts could not inherently recognize these patterns. In this paper, multi-resolution wavelet analysis is used to extract features. A self-organizing map then generates cluster vectors with wavelet coefficients. Using these features, a back-propagation network classifies unnatural patterns. The performance evaluation result is better than those of other competitive methods.",

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AU - Kim, Jun Seok

AU - Park, Sang Hoon

AU - Park, Cheong Sool

AU - Ko, Hyo Heon

AU - Kim, Sung Shick

AU - Baek, Jun Geol

PY - 2012/6

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N2 - Control chart pattern recognition is one of the most important tools in the identification of process problems in modern manufacturing industries. Abnormal patterns including systematic, cyclic, drift, and shift could be involved with certain assignable causes. Conventional control charts could not inherently recognize these patterns. In this paper, multi-resolution wavelet analysis is used to extract features. A self-organizing map then generates cluster vectors with wavelet coefficients. Using these features, a back-propagation network classifies unnatural patterns. The performance evaluation result is better than those of other competitive methods.

AB - Control chart pattern recognition is one of the most important tools in the identification of process problems in modern manufacturing industries. Abnormal patterns including systematic, cyclic, drift, and shift could be involved with certain assignable causes. Conventional control charts could not inherently recognize these patterns. In this paper, multi-resolution wavelet analysis is used to extract features. A self-organizing map then generates cluster vectors with wavelet coefficients. Using these features, a back-propagation network classifies unnatural patterns. The performance evaluation result is better than those of other competitive methods.

KW - Artificial neural network

KW - Control charts

KW - Feature extraction

KW - Multi-class classification

KW - Pattern recognition

KW - Wavelet analysis

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JF - Advanced Science Letters

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Control chart pattern recognition of manufacturing process using wavelet feature-based artificial neural networks

Abstract

Keywords

ASJC Scopus subject areas

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