Control chart pattern recognition of manufacturing process using wavelet feature-based artificial neural networks

  • Jun Seok Kim
  • , Sang Hoon Park
  • , Cheong Sool Park
  • , Hyo Heon Ko
  • , Sung Shick Kim
  • , Jun Geol Baek*
    • *Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    3 Citations (Scopus)

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    Keyphrases

    Engineering

    Computer Science

    Chemical Engineering

    Material Science