Keyphrases
Feature-based
100%
Artificial Neural Network
100%
Manufacturing Process
100%
Wavelet Features
100%
Control Chart Pattern Recognition
100%
Performance Evaluation
50%
Control Chart
50%
Evaluation Results
50%
Back Propagation Network
50%
Self-organizing Map
50%
Wavelet Coefficients
50%
Conventional Control
50%
Assignable Cause
50%
Competitive Method
50%
Wavelet multi-resolution Analysis
50%
Extracting Features
50%
Unnatural Pattern
50%
Traditional Manufacturing Industry
50%
Abnormal Pattern
50%
Engineering
Control Charts
100%
Pattern Recognition
100%
Manufacturing Process
100%
Artificial Neural Network
100%
Modern Manufacturing
33%
Backpropagation Network
33%
Self-Organizing Map
33%
Computer Science
Neural Network
100%
Pattern Recognition
100%
Performance Evaluation
50%
Evaluation Result
50%
Organizing Map
50%
Process Problem
50%
Wavelet Coefficient
50%