Control of refractive index by annealing to achieve high figure of merit for TiO2/Ag/TiO2 multilayer films

  • Jae Ho Kim
  • , Dae Hyun Kim
  • , Sun Kyung Kim
  • , Dukkyu Bae
  • , Young Zo Yoo
  • , Tae Yeon Seong*
  • *Corresponding author for this work

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