Keyphrases
Assembly Conditions
33%
Atomic Force Microscope
100%
Atomic Force Microscope Tips
66%
Carbon Nanotube Tip
100%
Carbon Nanotubes
33%
Controlled Assembly
100%
Dielectrophoresis
33%
Dielectrophoretic Force
33%
Diluted Solutions
33%
Electric Field (E-field)
33%
Fluid Field
33%
Gold Particles
33%
High Failure Rate
33%
Multi-walled Carbon Nanotubes (MWCNTs)
33%
Non-uniform Electric Field
33%
Silicon Tips
33%
Simulation Experiment
100%
Success Rate
33%
Engineering
Atomic Force Microscope
100%
Carbon Nanotube
100%
Electric Field
20%
Nonuniform Electric Field
20%
Simulation Experiment
100%
Simulation Result
20%
Success Rate
40%
Material Science
Carbon Nanotube
100%
Silicon
20%