Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam

C. S. Han, J. K. Park, Y. H. Yoon, Y. H. Shin

Research output: Contribution to journalLetterpeer-review

6 Citations (Scopus)
Original languageEnglish
Pages (from-to)3375-3378
Number of pages4
Issue number15
Publication statusPublished - 2006 Dec
Externally publishedYes

Bibliographical note

Funding Information:
This work was supported by the Center for Nano Mechatronics and Manufacturing (CNMM) in Korea. The authors thank NNFC in Korea for FIB work and G.-H. Lee in Pohang University for AAO template.


  • Atomic force microscopy
  • Carbon nanotube
  • Focused ion beam

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)

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