Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam

C. S. Han; J. K. Park; Y. H. Yoon; Y. H. Shin

doi:10.1016/j.carbon.2006.06.017

Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam

C. S. Han, J. K. Park, Y. H. Yoon, Y. H. Shin

Research output: Contribution to journal › Letter › peer-review

Original language	English
Pages (from-to)	3375-3378
Number of pages	4
Journal	Carbon
Volume	44
Issue number	15
DOIs	https://doi.org/10.1016/j.carbon.2006.06.017
Publication status	Published - 2006 Dec
Externally published	Yes

Bibliographical note

Funding Information:
This work was supported by the Center for Nano Mechatronics and Manufacturing (CNMM) in Korea. The authors thank NNFC in Korea for FIB work and G.-H. Lee in Pohang University for AAO template.

Keywords

Atomic force microscopy
Carbon nanotube
Focused ion beam

ASJC Scopus subject areas

Chemistry(all)
Materials Science(all)

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10.1016/j.carbon.2006.06.017

Cite this

@article{a538568c717f494cbd2ff22cc4f9cacb,

title = "Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam",

keywords = "Atomic force microscopy, Carbon nanotube, Focused ion beam",

author = "Han, {C. S.} and Park, {J. K.} and Yoon, {Y. H.} and Shin, {Y. H.}",

note = "Funding Information: This work was supported by the Center for Nano Mechatronics and Manufacturing (CNMM) in Korea. The authors thank NNFC in Korea for FIB work and G.-H. Lee in Pohang University for AAO template.",

year = "2006",

month = dec,

doi = "10.1016/j.carbon.2006.06.017",

language = "English",

volume = "44",

pages = "3375--3378",

journal = "Carbon",

issn = "0008-6223",

publisher = "Elsevier Limited",

number = "15",

}

TY - JOUR

T1 - Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam

AU - Han, C. S.

AU - Park, J. K.

AU - Yoon, Y. H.

AU - Shin, Y. H.

N1 - Funding Information: This work was supported by the Center for Nano Mechatronics and Manufacturing (CNMM) in Korea. The authors thank NNFC in Korea for FIB work and G.-H. Lee in Pohang University for AAO template.

PY - 2006/12

Y1 - 2006/12

KW - Atomic force microscopy

KW - Carbon nanotube

KW - Focused ion beam

UR - http://www.scopus.com/inward/record.url?scp=33751003804&partnerID=8YFLogxK

U2 - 10.1016/j.carbon.2006.06.017

DO - 10.1016/j.carbon.2006.06.017

M3 - Letter

AN - SCOPUS:33751003804

SN - 0008-6223

VL - 44

SP - 3375

EP - 3378

JO - Carbon

JF - Carbon

IS - 15

ER -

Controlled modification of the morphology and structure of carbon nanotube probes using a focused ion beam

Bibliographical note

Keywords

ASJC Scopus subject areas

Access to Document

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Cite this