Abstract
Through the field induced manipulation of clusters and the systematic analysis of tunneling I-V characteristics on clusters formed on Sb-terminated Si(100) surfaces, it is found that the lateral tunneling between the adjacent clusters is a major conduction mechanism for the appearance of Coulomb staircases in tunneling I-V characteristics. Furthermore, by using the newly devised I-V sweep modes, it is found that Coulomb staircases could also result from the cluster-coated tip. It is also observed that current oscillations give rise to the staircase-like features but should be distinguished from the real Coulomb staircases. These results will be very useful in understanding the tunneling I-V data with a STM facility.
Original language | English |
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Pages (from-to) | 2365-2370 |
Number of pages | 6 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 18 |
Issue number | 5 |
DOIs | |
Publication status | Published - 2000 Sept |
Externally published | Yes |
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering