Covered source-channel tunnel field-effect transistors with trench gate structures

Sola Woo, Sangsig Kim

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


We propose a new design for covered source-channel tunnel field-effect transistors (CSC-TFETs) with trench gate structures. The I-V characteristics, on/off current ratio, subthreshold swing, and band-to-band tunneling rate are analyzed using a commercial device simulator. Our proposed CSC-TFETs exhibit an on/off current ratio of approximately 1010, an on-current of approximately 10-5 A/μm at room temperature, and a subthreshold swing of less than 40 mV/decade. In addition, the on-current of the CSC-TFETs is ∼233 times that of conventional TFETs, demonstrating that the switching characteristics are superior to those of other silicon-based TFETs. Moreover, a CSC-TFET inverter is characterized by SPICE calibration and provides a high frequency of approximately 1 GHz at a supply voltage of 1.0 V.

Original languageEnglish
Article number8554273
Pages (from-to)114-118
Number of pages5
JournalIEEE Transactions on Nanotechnology
Publication statusPublished - 2019

Bibliographical note

Funding Information:
Manuscript received October 16, 2018; accepted November 17, 2018. Date of publication November 30, 2018; date of current version December 31, 2018. This work was supported in part by the National Research Foundation of Korea Grant funded by the Korean Government (MSIP) (NRF-2013R1A2A1A03070750, NRF-2015R1A2A1A15055437), in part by the Ministry of Trade, Industry and Energy (MOTIE, South Korea) under Industrial Strategic Technology Development Program, (10067791, “Development of fabrication and device structure of feedback Si channel 1T-SRAM for artificial intelligence”), in part by the Brain Korea 21 Plus Project in 2018, and in part by the Samsung Electronics. The review of this paper was arranged by Associate Editor S. Mohanty. (Corresponding author: Sangsig Kim.) The authors are with the Department of Electrical Engineering, Korea University, Seoul 02841, South Korea (e-mail:,; sangsig@korea.

Publisher Copyright:
© 2002-2012 IEEE.


  • SPICE model
  • TCAD simulation
  • Tunnel field-effect transistors
  • covered source-channel TFET
  • trench gate

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering


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