Crystallization kinetics of sol-gel-derived (1-x)SrBi2Ta2O9-xBi3 TiTaO9 ferroelectric thin films

Woo Chul Kwak; Yun Mo Sung

doi:10.1557/JMR.2002.0217

Crystallization kinetics of sol-gel-derived (1-x)SrBi₂Ta₂O₉-xBi₃ TiTaO₉ ferroelectric thin films

Woo Chul Kwak, Yun Mo Sung

Research output: Contribution to journal › Article › peer-review

23 Citations (Scopus)

Abstract

The crystallization kinetics of Sr_0.7Bi_2.3Ta₂O₉ (SBT) and 0.7SrBi₂Ta₂O₉-0.3Bi₃ TiTaO₉ (SBT-BTT) thin films formed by the sol-gel and spin coating techniques were studied. Phase formation and crystal growth are greatly affected by the film composition and crystallization temperature. Isothermal kinetic analysis was performed on the x-ray diffraction results of the thin films heated in the range of 730 to 760 °C at 10 °C intervals. Activation energy and Avrami exponent values were determined for the fluorite-to-Aurivillus phase transformation. A reduction of approximately 51 kJ/mol in activation energy was observed for the SBT-BTT thin films, and an Avrami exponent value of approximately 1.0 was obtained for both the SBT and SBT-BTT. A comparison is made, and the possible crystallization mechanism is discussed.

Original language	English
Pages (from-to)	1463-1468
Number of pages	6
Journal	Journal of Materials Research
Volume	17
Issue number	6
DOIs	https://doi.org/10.1557/JMR.2002.0217
Publication status	Published - 2002 Jun
Externally published	Yes

Bibliographical note

Funding Information:
This work was supported by the Korea Research Foundation, Grant No. KRF-2000-041-E00542. The authors appreciate the invaluable comments from the unknown reviewers.

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1557/JMR.2002.0217

Cite this

@article{870a2ee72c5149ae99b9485292be2c3c,

title = "Crystallization kinetics of sol-gel-derived (1-x)SrBi2Ta2O9-xBi3 TiTaO9 ferroelectric thin films",

abstract = "The crystallization kinetics of Sr0.7Bi2.3Ta2O9 (SBT) and 0.7SrBi2Ta2O9-0.3Bi3 TiTaO9 (SBT-BTT) thin films formed by the sol-gel and spin coating techniques were studied. Phase formation and crystal growth are greatly affected by the film composition and crystallization temperature. Isothermal kinetic analysis was performed on the x-ray diffraction results of the thin films heated in the range of 730 to 760 °C at 10 °C intervals. Activation energy and Avrami exponent values were determined for the fluorite-to-Aurivillus phase transformation. A reduction of approximately 51 kJ/mol in activation energy was observed for the SBT-BTT thin films, and an Avrami exponent value of approximately 1.0 was obtained for both the SBT and SBT-BTT. A comparison is made, and the possible crystallization mechanism is discussed.",

author = "Kwak, {Woo Chul} and Sung, {Yun Mo}",

note = "Funding Information: This work was supported by the Korea Research Foundation, Grant No. KRF-2000-041-E00542. The authors appreciate the invaluable comments from the unknown reviewers.",

year = "2002",

month = jun,

doi = "10.1557/JMR.2002.0217",

language = "English",

volume = "17",

pages = "1463--1468",

journal = "Journal of Materials Research",

issn = "0884-2914",

publisher = "Materials Research Society",

number = "6",

}

TY - JOUR

T1 - Crystallization kinetics of sol-gel-derived (1-x)SrBi2Ta2O9-xBi3 TiTaO9 ferroelectric thin films

AU - Kwak, Woo Chul

AU - Sung, Yun Mo

N1 - Funding Information: This work was supported by the Korea Research Foundation, Grant No. KRF-2000-041-E00542. The authors appreciate the invaluable comments from the unknown reviewers.

PY - 2002/6

Y1 - 2002/6

N2 - The crystallization kinetics of Sr0.7Bi2.3Ta2O9 (SBT) and 0.7SrBi2Ta2O9-0.3Bi3 TiTaO9 (SBT-BTT) thin films formed by the sol-gel and spin coating techniques were studied. Phase formation and crystal growth are greatly affected by the film composition and crystallization temperature. Isothermal kinetic analysis was performed on the x-ray diffraction results of the thin films heated in the range of 730 to 760 °C at 10 °C intervals. Activation energy and Avrami exponent values were determined for the fluorite-to-Aurivillus phase transformation. A reduction of approximately 51 kJ/mol in activation energy was observed for the SBT-BTT thin films, and an Avrami exponent value of approximately 1.0 was obtained for both the SBT and SBT-BTT. A comparison is made, and the possible crystallization mechanism is discussed.

AB - The crystallization kinetics of Sr0.7Bi2.3Ta2O9 (SBT) and 0.7SrBi2Ta2O9-0.3Bi3 TiTaO9 (SBT-BTT) thin films formed by the sol-gel and spin coating techniques were studied. Phase formation and crystal growth are greatly affected by the film composition and crystallization temperature. Isothermal kinetic analysis was performed on the x-ray diffraction results of the thin films heated in the range of 730 to 760 °C at 10 °C intervals. Activation energy and Avrami exponent values were determined for the fluorite-to-Aurivillus phase transformation. A reduction of approximately 51 kJ/mol in activation energy was observed for the SBT-BTT thin films, and an Avrami exponent value of approximately 1.0 was obtained for both the SBT and SBT-BTT. A comparison is made, and the possible crystallization mechanism is discussed.

UR - http://www.scopus.com/inward/record.url?scp=0036600827&partnerID=8YFLogxK

U2 - 10.1557/JMR.2002.0217

DO - 10.1557/JMR.2002.0217

M3 - Article

AN - SCOPUS:0036600827

SN - 0884-2914

VL - 17

SP - 1463

EP - 1468

JO - Journal of Materials Research

JF - Journal of Materials Research

IS - 6

ER -