Current insertion transient response for measuring phase margin in negative feedback system

Bong No Yoon; Seung Woo Yu; Man Young Sung

doi:10.1109/EDSSC.2007.4450141

Current insertion transient response for measuring phase margin in negative feedback system

Bong No Yoon, Seung Woo Yu, Man Young Sung

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This paper presents a current insertion transient method which can be applied to determine the system stability. Mathematical consideration is described which shows relationship between phase margin and stability. Total gain 93dB operational amplifier (Op Amp) is designed in order to apply the proposed transient response. A analog circuit designer may easily investigate his or her own system's fitness with this method.

Original language	English
Title of host publication	IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007
Pages	377-380
Number of pages	4
DOIs	https://doi.org/10.1109/EDSSC.2007.4450141
Publication status	Published - 2007
Event	IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007 - Tainan, Taiwan, Province of China Duration: 2007 Dec 20 → 2007 Dec 22

Publication series

Name	IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007

Other

Other	IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007
Country/Territory	Taiwan, Province of China
City	Tainan
Period	07/12/20 → 07/12/22

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/EDSSC.2007.4450141

Cite this

Yoon, B. N., Yu, S. W., & Sung, M. Y. (2007). Current insertion transient response for measuring phase margin in negative feedback system. In IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007 (pp. 377-380). Article 4450141 (IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007). https://doi.org/10.1109/EDSSC.2007.4450141

Current insertion transient response for measuring phase margin in negative feedback system. / Yoon, Bong No; Yu, Seung Woo; Sung, Man Young.
IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007. 2007. p. 377-380 4450141 (IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Yoon, BN, Yu, SW & Sung, MY 2007, Current insertion transient response for measuring phase margin in negative feedback system. in IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007., 4450141, IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007, pp. 377-380, IEEE Conference on Electron Devices and Solid-State Circuits 2007, EDSSC 2007, Tainan, Taiwan, Province of China, 07/12/20. https://doi.org/10.1109/EDSSC.2007.4450141

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Current insertion transient response for measuring phase margin in negative feedback system

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