Deep Survival Analysis from Whole Slide Images: A Multiple Instance Learning Approach

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Survival analysis plays a critical role in oncology for patient care, but analyzing Whole Slide Images (WSIs) presents challenges due to their immense size and inherent variability. Traditional approaches often rely on manual Region of Interest (ROI) selection, which introduces subjectivity and limits scalability. In this paper, we propose Surv-MIL, a novel deep survival model based on Multiple Instance Learning (MIL) that processes WSIs without the need for ROI selection. Our approach divides WSIs into patches, extracts features using a pre-trained encoder, and then aggregates this information using a gated attention mechanism. This enables the model to focus on salient tumor regions while effectively handling the variability in WSI sizes. Evaluated on a real-world dataset, our method demonstrates superior performance compared to other deep survival models. This scalable framework effectively leverages the rich information contained within WSIs for survival analysis, potentially leading to improved prognosis prediction and treatment planning in oncology.

Original languageEnglish
Title of host publicationICTC 2024 - 15th International Conference on ICT Convergence
Subtitle of host publicationAI-Empowered Digital Innovation
PublisherIEEE Computer Society
Pages30-35
Number of pages6
ISBN (Electronic)9798350364637
DOIs
Publication statusPublished - 2024
Event15th International Conference on Information and Communication Technology Convergence, ICTC 2024 - Jeju Island, Korea, Republic of
Duration: 2024 Oct 162024 Oct 18

Publication series

NameInternational Conference on ICT Convergence
ISSN (Print)2162-1233
ISSN (Electronic)2162-1241

Conference

Conference15th International Conference on Information and Communication Technology Convergence, ICTC 2024
Country/TerritoryKorea, Republic of
CityJeju Island
Period24/10/1624/10/18

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • multiple instance learning
  • survival analysis
  • time-to-event analysis
  • whole slide image

ASJC Scopus subject areas

  • Information Systems
  • Computer Networks and Communications

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