Defect analysis of a MELO-Si over SiO2 strips of different widths and spacings

Jungho James Pak, Bong Soo Kim, Gerold W. Neudeck

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Defect analysis of a MELO-Si over SiO2 strips of different widths and spacings'. Together they form a unique fingerprint.

Physics & Astronomy