Defect Information Synthesis via Latent Mapping Adversarial Networks

Keyphrases

• Adversarial Network 100%
• Automated Visual Inspection 50%
• Classification Model 25%
• Computational Speed 25%
• Convergence Rate 25%
• Defect Detection 50%
• Defect Image 100%
• Defect Information 100%
• Economic Factors 25%
• Generative Adversarial Networks 25%
• Image Synthesis 25%
• Information Synthesis 100%
• Latent Mapping 100%
• Latent Space 50%
• Loss Function 25%
• Majority Class 25%
• Manufacturing Process 50%
• Mapping Network 25%
• Novel Methodology 25%
• Performance Improvement 25%
• Proposed Methodology 25%
• Quantitative Metrics 25%
• Steel Manufacturing Process 25%
• StyleGAN 25%
• Synthesis Methods 25%

Computer Science

• Classification Models 50%
• Domain Knowledge 50%
• Experimental Result 50%
• Generative Adversarial Networks 50%
• Image Synthesis 50%
• Information Synthesis 100%
• Majority Class 50%
• Quantitative Metric 50%
• Visual Inspection 100%

Engineering

• Defect Detection 50%
• Defect Image 100%
• Domain Knowledge 25%
• Experimental Result 25%
• Illustrates 25%
• Image Synthesis 25%
• Loss Function 25%
• Manufacturing Process 75%
• Metrics 25%
• Visual Inspection 50%