Degradation by sidewall recombination centers in GaN blue micro-LEDs at diameters<30 µm
In Hwan Lee, Tae Hwan Kim, A. Y. Polyakov, A. V. Chernykh, M. L. Skorikov, E. B. Yakimov, L. A. Alexanyan, I. V. Shchemerov, A. A. Vasilev, S. J. Pearton
Dive into the research topics of 'Degradation by sidewall recombination centers in GaN blue micro-LEDs at diameters<30 µm'. Together they form a unique fingerprint.