Degradation by sidewall recombination centers in GaN blue micro-LEDs at diameters<30 µm

In Hwan Lee, Tae Hwan Kim, A. Y. Polyakov, A. V. Chernykh, M. L. Skorikov, E. B. Yakimov, L. A. Alexanyan, I. V. Shchemerov, A. A. Vasilev, S. J. Pearton

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Engineering

Chemistry

Material Science

Physics

Chemical Engineering