Dependence of optical and electrical properties on Ag thickness in TiO2/Ag/TiO2 multilayer films for photovoltaic devices

Jun Ho Kim; Han Kyeol Lee; Jin Young Na; Sun Kyung Kim; Young Zo Yoo; Tae Yeon Seong

doi:10.1016/j.ceramint.2015.03.002

Dependence of optical and electrical properties on Ag thickness in TiO₂/Ag/TiO₂ multilayer films for photovoltaic devices

Jun Ho Kim, Han Kyeol Lee, Jin Young Na, Sun Kyung Kim, Young Zo Yoo, Tae Yeon Seong

Research output: Contribution to journal › Article › peer-review

46 Citations (Scopus)

Abstract

We report on the formation of highly transparent and low conductance TiO₂/Ag/TiO₂ multilayer films with high figure of merit (FOM). The optical and electrical properties of the multilayer films were investigated as a function of Ag layer thickness. As the Ag thickness increased, the transmission window narrowed and the transmittance was gradually lowered. The TiO₂/Ag/TiO₂ multilayer films have the highest transmittance of 86.3-97% at 591 nm for different Ag thicknesses. The relationship between transmittance and TiO₂ thickness was simulated using the scattering matrix method to understand the abnormally high transmittance. As the Ag thickness increased from 15 to 25 nm, the carrier concentration of the TiO₂/Ag/TiO₂ samples gradually increased from 6.18×10²¹ to 1.07×10²² cm^-3 and the mobility also increased from 16.7 to 25.2 cm²/V-s. Meanwhile, the sheet resistance slightly decreased from 6.17 to 2.27 Ωâ§şq with the Ag thickness. The TiO₂/Ag/TiO₂ multilayer (with Ag thicknesses of 17-21 nm) had Haacke's FOMs of 121×10^-3-157.2×10^-3 Ω^-1.

Original language	English
Pages (from-to)	8059-8063
Number of pages	5
Journal	Ceramics International
Volume	41
Issue number	6
DOIs	https://doi.org/10.1016/j.ceramint.2015.03.002
Publication status	Published - 2015 Jul 1

Bibliographical note

Funding Information:
This work was supported by Korea Evaluation Institute of Industrial Technology (Grant no. 10049601 ). S.-K.K. acknowledges support of this work by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning ( NRF-2013R1A1A1059423 ).

Publisher Copyright:
© 2015 Elsevier Ltd. and Techna Group S.r.l. All rights reserved.

Keywords

Ag
D. TiO
Multilayer
Transparent conducting electrode

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Ceramics and Composites
Process Chemistry and Technology
Surfaces, Coatings and Films
Materials Chemistry

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1016/j.ceramint.2015.03.002

Cite this

@article{f70ce4f3a1754860a6410b2f8ea5c137,

title = "Dependence of optical and electrical properties on Ag thickness in TiO2/Ag/TiO2 multilayer films for photovoltaic devices",

abstract = "We report on the formation of highly transparent and low conductance TiO2/Ag/TiO2 multilayer films with high figure of merit (FOM). The optical and electrical properties of the multilayer films were investigated as a function of Ag layer thickness. As the Ag thickness increased, the transmission window narrowed and the transmittance was gradually lowered. The TiO2/Ag/TiO2 multilayer films have the highest transmittance of 86.3-97% at 591 nm for different Ag thicknesses. The relationship between transmittance and TiO2 thickness was simulated using the scattering matrix method to understand the abnormally high transmittance. As the Ag thickness increased from 15 to 25 nm, the carrier concentration of the TiO2/Ag/TiO2 samples gradually increased from 6.18×1021 to 1.07×1022 cm-3 and the mobility also increased from 16.7 to 25.2 cm2/V-s. Meanwhile, the sheet resistance slightly decreased from 6.17 to 2.27 Ω{\^a}§{\c s}q with the Ag thickness. The TiO2/Ag/TiO2 multilayer (with Ag thicknesses of 17-21 nm) had Haacke's FOMs of 121×10-3-157.2×10-3 Ω-1.",

keywords = "Ag, D. TiO, Multilayer, Transparent conducting electrode",

author = "Kim, {Jun Ho} and Lee, {Han Kyeol} and Na, {Jin Young} and Kim, {Sun Kyung} and Yoo, {Young Zo} and Seong, {Tae Yeon}",

note = "Funding Information: This work was supported by Korea Evaluation Institute of Industrial Technology (Grant no. 10049601 ). S.-K.K. acknowledges support of this work by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning ( NRF-2013R1A1A1059423 ). Publisher Copyright: {\textcopyright} 2015 Elsevier Ltd. and Techna Group S.r.l. All rights reserved.",

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T1 - Dependence of optical and electrical properties on Ag thickness in TiO2/Ag/TiO2 multilayer films for photovoltaic devices

AU - Kim, Jun Ho

AU - Lee, Han Kyeol

AU - Na, Jin Young

AU - Kim, Sun Kyung

AU - Yoo, Young Zo

AU - Seong, Tae Yeon

N1 - Funding Information: This work was supported by Korea Evaluation Institute of Industrial Technology (Grant no. 10049601 ). S.-K.K. acknowledges support of this work by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning ( NRF-2013R1A1A1059423 ). Publisher Copyright: © 2015 Elsevier Ltd. and Techna Group S.r.l. All rights reserved.

PY - 2015/7/1

Y1 - 2015/7/1

N2 - We report on the formation of highly transparent and low conductance TiO2/Ag/TiO2 multilayer films with high figure of merit (FOM). The optical and electrical properties of the multilayer films were investigated as a function of Ag layer thickness. As the Ag thickness increased, the transmission window narrowed and the transmittance was gradually lowered. The TiO2/Ag/TiO2 multilayer films have the highest transmittance of 86.3-97% at 591 nm for different Ag thicknesses. The relationship between transmittance and TiO2 thickness was simulated using the scattering matrix method to understand the abnormally high transmittance. As the Ag thickness increased from 15 to 25 nm, the carrier concentration of the TiO2/Ag/TiO2 samples gradually increased from 6.18×1021 to 1.07×1022 cm-3 and the mobility also increased from 16.7 to 25.2 cm2/V-s. Meanwhile, the sheet resistance slightly decreased from 6.17 to 2.27 Ωâ§şq with the Ag thickness. The TiO2/Ag/TiO2 multilayer (with Ag thicknesses of 17-21 nm) had Haacke's FOMs of 121×10-3-157.2×10-3 Ω-1.

AB - We report on the formation of highly transparent and low conductance TiO2/Ag/TiO2 multilayer films with high figure of merit (FOM). The optical and electrical properties of the multilayer films were investigated as a function of Ag layer thickness. As the Ag thickness increased, the transmission window narrowed and the transmittance was gradually lowered. The TiO2/Ag/TiO2 multilayer films have the highest transmittance of 86.3-97% at 591 nm for different Ag thicknesses. The relationship between transmittance and TiO2 thickness was simulated using the scattering matrix method to understand the abnormally high transmittance. As the Ag thickness increased from 15 to 25 nm, the carrier concentration of the TiO2/Ag/TiO2 samples gradually increased from 6.18×1021 to 1.07×1022 cm-3 and the mobility also increased from 16.7 to 25.2 cm2/V-s. Meanwhile, the sheet resistance slightly decreased from 6.17 to 2.27 Ωâ§şq with the Ag thickness. The TiO2/Ag/TiO2 multilayer (with Ag thicknesses of 17-21 nm) had Haacke's FOMs of 121×10-3-157.2×10-3 Ω-1.

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