Dependence of Q factor on surface roughness in a plasmonic cavity

Yoon Ho Kim; Soon Hong Kwon; Ho Seok Ee; Yongsop Hwang; You Shin No; Hong Gyu Park

doi:10.3807/JOSK.2016.20.1.188

Dependence of Q factor on surface roughness in a plasmonic cavity

Yoon Ho Kim, Soon Hong Kwon, Ho Seok Ee, Yongsop Hwang, You Shin No, Hong Gyu Park

Department of Physics

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

We investigated surface-roughness-dependent optical loss in a plasmonic cavity consisting of a semiconductor nanodisk/silver nanopan structure. Numerical simulations show that the quality factors of plasmonic resonant modes significantly depend on the surface roughness of the dielectric-metal interface in the cavity structure. In the transverse-magnetic-like whispering-gallery plasmonic mode excited in a structure with disk diameter of 1000 nm, the total quality factor decreased from 260 to 130 with increasing root-mean-square (rms) surface roughness from 0 to 5 nm. This quantitative theoretical study shows that the smooth metal surface plays a critical role in high-performance plasmonic devices.

Original language	English
Pages (from-to)	188-191
Number of pages	4
Journal	Journal of the Optical Society of Korea
Volume	20
Issue number	1
DOIs	https://doi.org/10.3807/JOSK.2016.20.1.188
Publication status	Published - 2016 Feb 1

Keywords

Finite-difference time-domain simulations
Plasmonic cavities
Surface plasmon polaritons
Surface roughness

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.3807/JOSK.2016.20.1.188

Cite this

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abstract = "We investigated surface-roughness-dependent optical loss in a plasmonic cavity consisting of a semiconductor nanodisk/silver nanopan structure. Numerical simulations show that the quality factors of plasmonic resonant modes significantly depend on the surface roughness of the dielectric-metal interface in the cavity structure. In the transverse-magnetic-like whispering-gallery plasmonic mode excited in a structure with disk diameter of 1000 nm, the total quality factor decreased from 260 to 130 with increasing root-mean-square (rms) surface roughness from 0 to 5 nm. This quantitative theoretical study shows that the smooth metal surface plays a critical role in high-performance plasmonic devices.",

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AU - Kwon, Soon Hong

AU - Ee, Ho Seok

AU - Hwang, Yongsop

AU - No, You Shin

AU - Park, Hong Gyu

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AB - We investigated surface-roughness-dependent optical loss in a plasmonic cavity consisting of a semiconductor nanodisk/silver nanopan structure. Numerical simulations show that the quality factors of plasmonic resonant modes significantly depend on the surface roughness of the dielectric-metal interface in the cavity structure. In the transverse-magnetic-like whispering-gallery plasmonic mode excited in a structure with disk diameter of 1000 nm, the total quality factor decreased from 260 to 130 with increasing root-mean-square (rms) surface roughness from 0 to 5 nm. This quantitative theoretical study shows that the smooth metal surface plays a critical role in high-performance plasmonic devices.

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Dependence of Q factor on surface roughness in a plasmonic cavity

Abstract

Keywords

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