Detecting trapdoors in smart cards using timing and power analysis

For economic reasons, in spite of security problems, the commands of re-initializing the card and writing patch code are widely used in smart cards. The current software tester has difficulty in detecting these trapdoor commands by reason that trapdoors are not published and programmed sophisticatedly. Up to now the effective way to detect them is to completely reveal and analyze the entire code of the COS with applications such as the ITSEC. It is, however, very time-consuming and expensive processes. We propose a new approach of detecting trapdoors in smart cards using timing and power analysis. By experiments, this paper shows that this approach is a more practical method than the current methods.