TY - GEN
T1 - Detection and removal of long scratch lines in aged films
AU - Shih, Timothy K.
AU - Lin, Louis H.
AU - Lee, Wonjun
N1 - Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.
PY - 2006
Y1 - 2006
N2 - Historical films usually have defects. We study the type of defects, and propose a series of solutions to detect defects before they are repaired by our inpainting algorithms. This paper focuses on a difficult issue to locate long vertical line defects in aged films. A progressive detection algorithm is proposed. We are able to detect more than 86% (recall rate) of effective line defects. These line defects are then removed step by step. The experiments use real historical video collected from national museum and public channel, instead of using computer generated noise. The results are visually pleasant based on our subjective evaluation by volunteers.
AB - Historical films usually have defects. We study the type of defects, and propose a series of solutions to detect defects before they are repaired by our inpainting algorithms. This paper focuses on a difficult issue to locate long vertical line defects in aged films. A progressive detection algorithm is proposed. We are able to detect more than 86% (recall rate) of effective line defects. These line defects are then removed step by step. The experiments use real historical video collected from national museum and public channel, instead of using computer generated noise. The results are visually pleasant based on our subjective evaluation by volunteers.
UR - http://www.scopus.com/inward/record.url?scp=34247647133&partnerID=8YFLogxK
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U2 - 10.1109/ICME.2006.262576
DO - 10.1109/ICME.2006.262576
M3 - Conference contribution
AN - SCOPUS:34247647133
SN - 1424403677
SN - 9781424403677
T3 - 2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Proceedings
SP - 477
EP - 480
BT - 2006 IEEE International Conference on Multimedia and Expo, ICME 2006 - Proceedings
T2 - 2006 IEEE International Conference on Multimedia and Expo, ICME 2006
Y2 - 9 July 2006 through 12 July 2006
ER -