Detection and removal of long scratch lines in aged films

  • Timothy K. Shih*
  • , Louis H. Lin
  • , Wonjun Lee
    • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    20 Citations (Scopus)

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    Keyphrases

    Computer Science

    Engineering

    Mathematics

    Immunology and Microbiology