Detection and volume estimation of semiconductor quantum dots from atomic force microscope images

Sangwook Oh; Chankyeong Hyon; Sanghoon Sull; Sungwoo Hwang; Yongju Park

doi:10.1063/1.1618015

Detection and volume estimation of semiconductor quantum dots from atomic force microscope images

Sangwook Oh, Chankyeong Hyon, Sanghoon Sull, Sungwoo Hwang, Yongju Park

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

The data from atomic force microscope images was analyzed for the detection and volume estimation of semiconductor quantum dots. The image-segmentation method was used for the quantum dot detection. The boundary of the quantum dot at each height step was determined for an effective volume estimation of the quantum dot. As the amount of the source material consumed could be predicted, the volume estimation was considered to be an important proceedure in the quantum dot growth.

Original language	English
Pages (from-to)	4687-4695
Number of pages	9
Journal	Review of Scientific Instruments
Volume	74
Issue number	11
DOIs	https://doi.org/10.1063/1.1618015
Publication status	Published - 2003 Nov

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Copyright 2008 Elsevier B.V., All rights reserved.

ASJC Scopus subject areas

Instrumentation

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10.1063/1.1618015

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title = "Detection and volume estimation of semiconductor quantum dots from atomic force microscope images",

abstract = "The data from atomic force microscope images was analyzed for the detection and volume estimation of semiconductor quantum dots. The image-segmentation method was used for the quantum dot detection. The boundary of the quantum dot at each height step was determined for an effective volume estimation of the quantum dot. As the amount of the source material consumed could be predicted, the volume estimation was considered to be an important proceedure in the quantum dot growth.",

author = "Sangwook Oh and Chankyeong Hyon and Sanghoon Sull and Sungwoo Hwang and Yongju Park",

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AU - Sull, Sanghoon

AU - Hwang, Sungwoo

AU - Park, Yongju

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AB - The data from atomic force microscope images was analyzed for the detection and volume estimation of semiconductor quantum dots. The image-segmentation method was used for the quantum dot detection. The boundary of the quantum dot at each height step was determined for an effective volume estimation of the quantum dot. As the amount of the source material consumed could be predicted, the volume estimation was considered to be an important proceedure in the quantum dot growth.

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Detection and volume estimation of semiconductor quantum dots from atomic force microscope images

Abstract

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