Abstract
The data from atomic force microscope images was analyzed for the detection and volume estimation of semiconductor quantum dots. The image-segmentation method was used for the quantum dot detection. The boundary of the quantum dot at each height step was determined for an effective volume estimation of the quantum dot. As the amount of the source material consumed could be predicted, the volume estimation was considered to be an important proceedure in the quantum dot growth.
Original language | English |
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Pages (from-to) | 4687-4695 |
Number of pages | 9 |
Journal | Review of Scientific Instruments |
Volume | 74 |
Issue number | 11 |
DOIs | |
Publication status | Published - 2003 Nov |
Bibliographical note
Copyright:Copyright 2008 Elsevier B.V., All rights reserved.
ASJC Scopus subject areas
- Instrumentation