Detection and volume estimation of semiconductor quantum dots from atomic force microscope images

Sangwook Oh, Chankyeong Hyon, Sanghoon Sull, Sungwoo Hwang, Yongju Park

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)

    Abstract

    The data from atomic force microscope images was analyzed for the detection and volume estimation of semiconductor quantum dots. The image-segmentation method was used for the quantum dot detection. The boundary of the quantum dot at each height step was determined for an effective volume estimation of the quantum dot. As the amount of the source material consumed could be predicted, the volume estimation was considered to be an important proceedure in the quantum dot growth.

    Original languageEnglish
    Pages (from-to)4687-4695
    Number of pages9
    JournalReview of Scientific Instruments
    Volume74
    Issue number11
    DOIs
    Publication statusPublished - 2003 Nov

    Bibliographical note

    Copyright:
    Copyright 2008 Elsevier B.V., All rights reserved.

    ASJC Scopus subject areas

    • Instrumentation

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