Detection and volume estimation of semiconductor quantum dots from atomic force microscope images

  • Sangwook Oh*
  • , Chankyeong Hyon
  • , Sanghoon Sull
  • , Sungwoo Hwang
  • , Yongju Park
  • *Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    5 Citations (Scopus)

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    Keyphrases

    Engineering

    Material Science

    Physics