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Developer Micro Interaction Metrics for Software Defect Prediction
Taek Lee
, Jaechang Nam
, Donggyun Han
, Sunghun Kim
,
Hoh Peter In
Research output
:
Contribution to journal
›
Article
›
peer-review
70
Citations (Scopus)
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Keyphrases
Microcontact
100%
Defect Prediction
100%
Interaction Metrics
100%
Software Defect Prediction
100%
Developer Interactions
66%
Prediction Metrics
66%
Prediction Accuracy
33%
Interaction Patterns
33%
Browsing
33%
Software Development
33%
Interaction Information
33%
Churn
33%
Software Quality
33%
Eclipse Plug-in
33%
Source Code Metrics
33%
Behavioural Interactions
33%
Mylyn
33%
Common Understanding
33%
Software Quality Assurance
33%
Software Measures
33%
Developer Behavior
33%
Computer Science
Defect Prediction
100%
Software Defect
100%
Prediction Accuracy
25%
Software Development
25%
Information Interaction
25%
Source Codes
25%
Software Quality
25%
Interaction Pattern
25%
Code Metrics
25%
Common Understanding
25%
Software Quality Assurance
25%