Abstract
A on-off keying (OOK) communication system is fabricated using 65-nm CMOS technology for 300 GHz operation. The structure of OOK modulator is a double-shunt which have insertion loss of 7.7 dB and on-off ratio of 11.6 dB. And performance of the modulator is close agreement with the results predicted by advanced design system (ADS) with capacitor model calibration. And the envelope detector is common-gate and single-ended structure. The performance of OOK communication system which the modulator and envelope detector are combined have a bit error rate (BER) lower than 10-9 at 800 Mbps.
Original language | English |
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Title of host publication | 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 4670-4672 |
Number of pages | 3 |
ISBN (Electronic) | 9781509060931 |
DOIs | |
Publication status | Published - 2016 Nov 3 |
Event | 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Shanghai, China Duration: 2016 Aug 8 → 2016 Aug 11 |
Publication series
Name | 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings |
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Conference
Conference | 2016 Progress In Electromagnetics Research Symposium, PIERS 2016 |
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Country/Territory | China |
City | Shanghai |
Period | 16/8/8 → 16/8/11 |
Bibliographical note
Publisher Copyright:© 2016 IEEE.
ASJC Scopus subject areas
- Instrumentation
- Radiation
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics