Development of 65-nm CMOS switch modulator for on-off keying communication systems at 300GHz

C. Yi, K. M. Lee, M. Kim

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    A on-off keying (OOK) communication system is fabricated using 65-nm CMOS technology for 300 GHz operation. The structure of OOK modulator is a double-shunt which have insertion loss of 7.7 dB and on-off ratio of 11.6 dB. And performance of the modulator is close agreement with the results predicted by advanced design system (ADS) with capacitor model calibration. And the envelope detector is common-gate and single-ended structure. The performance of OOK communication system which the modulator and envelope detector are combined have a bit error rate (BER) lower than 10-9 at 800 Mbps.

    Original languageEnglish
    Title of host publication2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages4670-4672
    Number of pages3
    ISBN (Electronic)9781509060931
    DOIs
    Publication statusPublished - 2016 Nov 3
    Event2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Shanghai, China
    Duration: 2016 Aug 82016 Aug 11

    Publication series

    Name2016 Progress In Electromagnetics Research Symposium, PIERS 2016 - Proceedings

    Conference

    Conference2016 Progress In Electromagnetics Research Symposium, PIERS 2016
    Country/TerritoryChina
    CityShanghai
    Period16/8/816/8/11

    Bibliographical note

    Publisher Copyright:
    © 2016 IEEE.

    ASJC Scopus subject areas

    • Instrumentation
    • Radiation
    • Electrical and Electronic Engineering
    • Atomic and Molecular Physics, and Optics

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