Development of a prototype SPECT system using a variable pinhole collimator

Hyemi Cha, Young Jun Jung, Eungi Min, Seungbin Bae, Mincheol Ko, Kyeong Min Kim, Kisung Lee, Hakjae Lee

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    1 Citation (Scopus)

    Abstract

    We designed a novel single-photon emission computed tomography (SPECT) system with a variable pinhole (VP) collimator for obtaining high-sensitivity and high-spatial resolution imaging of a region of interest (ROI). Extending the capabilities of conventional SPECT systems, this novel SPECT system with a VP collimator can adjust its driving parameters, such as a collimator diameter, acceptance angle, and distances between the ROI, collimator, and detector at different rotation angles. Previously, we simulated a VP collimator and demonstrated the superiority of the VP SPECT system in terms of its sensitivity and spatial resolution. Based on these previous results, we developed a prototype SPECT system for performance evaluation of a VP collimator. The collimator was made from 99.9% pure tungsten layers, with 16 holes of different diameters. The area of the CsI(Tl) scintillator was 45.7 × 45.7 mm2 (51 × 51 pixels), with pixel dimensions of 0.7 × 0.7 × 5 mm2. The multi-pixel photon counter was tiled into a 2 × 2 configuration with dimensions of 52 × 52 mm2. The collimator, detector, and gantry of this SPECT system were independently controlled. We acquired initial reconstructed images from a point source (Co-57) and an ultra-micro phantom (Tc-99m). The point source and the phantom were clearly resolved, demonstrating satisfactory detector response, signal processing, and imaging processing capabilities. The 1.35mm phantom was also clearly resolved in the ultra-micro phantom.

    Original languageEnglish
    Title of host publication2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Volume2017-January
    ISBN (Electronic)9781509016426
    DOIs
    Publication statusPublished - 2017 Oct 16
    Event2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016 - Strasbourg, France
    Duration: 2016 Oct 292016 Nov 6

    Other

    Other2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016
    Country/TerritoryFrance
    CityStrasbourg
    Period16/10/2916/11/6

    ASJC Scopus subject areas

    • Radiology Nuclear Medicine and imaging
    • Instrumentation
    • Nuclear and High Energy Physics
    • Electronic, Optical and Magnetic Materials

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