Dielectric properties of Ln(Mg 1/2 Ti 1/2 )O3 as substrates for high-Tc superconductor thin films

Seo Yong Cho; Chang Hun Kim; Dong Wan Kim; Kug Sun Hong; Jong Hee Kim

doi:10.1557/JMR.1999.0333

Dielectric properties of Ln(Mg_1/2Ti_1/2)O₃ as substrates for high-T_c superconductor thin films

Seo Yong Cho, Chang Hun Kim, Dong Wan Kim, Kug Sun Hong, Jong Hee Kim

Research output: Contribution to journal › Article › peer-review

125 Citations (Scopus)

Abstract

Ln(Mg_1/2Ti_1/2)O₃ (Ln = Dy, La, Nd, Pr, Sm, Y) compositions have been prepared, and their pertinent properties for use as thin film substrates for YBa₂Cu₃O_x (YBCO) were measured. X-ray diffraction shows that Ln(Mg_1/2Ti_1/2)O₃ compositions have noncubic symmetry and the GdFeO₃-type structure. Dielectric constant measurements revealed values between 22 and 27, which are larger than those of the LnAlO₃ family. Quality factor (= 1/tan δ) of the ceramic specimens measured at room temperature was larger than 3000 at 10 GHz. Among the compounds, La(Mg_1/2Ti_1/2)O₃ exhibited the highest dielectric constant and the lowest dielectric loss. Chemical reaction was observed between Ln(Mg_1/2Ti_1/2)O₃ (Ln = Dy, Sm, Y) and YBCO after annealing a 1:1 mixture at 950°C. Considering dielectric and physical properties, La(Mg_1/2Ti_1/2)O₃ and Sm(Mg_1/2Ti_1/2)O₃ were determined to be suitable substrates for YBCO thin film used in microwave applications.

Original language	English
Pages (from-to)	2484-2487
Number of pages	4
Journal	Journal of Materials Research
Volume	14
Issue number	6
DOIs	https://doi.org/10.1557/JMR.1999.0333
Publication status	Published - 1999 Jun
Externally published	Yes

ASJC Scopus subject areas

Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

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@article{f5f9b46bddb2488fbf067fe7e2de2ac8,

title = "Dielectric properties of Ln(Mg 1/2 Ti 1/2 )O3 as substrates for high-Tc superconductor thin films",

abstract = "Ln(Mg 1/2 Ti 1/2 )O3 (Ln = Dy, La, Nd, Pr, Sm, Y) compositions have been prepared, and their pertinent properties for use as thin film substrates for YBa2Cu3Ox (YBCO) were measured. X-ray diffraction shows that Ln(Mg 1/2 Ti 1/2 )O3 compositions have noncubic symmetry and the GdFeO3-type structure. Dielectric constant measurements revealed values between 22 and 27, which are larger than those of the LnAlO3 family. Quality factor (= 1/tan δ) of the ceramic specimens measured at room temperature was larger than 3000 at 10 GHz. Among the compounds, La(Mg 1/2 Ti 1/2 )O3 exhibited the highest dielectric constant and the lowest dielectric loss. Chemical reaction was observed between Ln(Mg 1/2 Ti 1/2 )O3 (Ln = Dy, Sm, Y) and YBCO after annealing a 1:1 mixture at 950°C. Considering dielectric and physical properties, La(Mg 1/2 Ti 1/2 )O3 and Sm(Mg 1/2 Ti 1/2 )O3 were determined to be suitable substrates for YBCO thin film used in microwave applications.",

author = "Cho, {Seo Yong} and Kim, {Chang Hun} and Kim, {Dong Wan} and Hong, {Kug Sun} and Kim, {Jong Hee}",

year = "1999",

month = jun,

doi = "10.1557/JMR.1999.0333",

language = "English",

volume = "14",

pages = "2484--2487",

journal = "Journal of Materials Research",

issn = "0884-2914",

publisher = "Materials Research Society",

number = "6",

}

TY - JOUR

T1 - Dielectric properties of Ln(Mg 1/2 Ti 1/2 )O3 as substrates for high-Tc superconductor thin films

AU - Cho, Seo Yong

AU - Kim, Chang Hun

AU - Kim, Dong Wan

AU - Hong, Kug Sun

AU - Kim, Jong Hee

PY - 1999/6

Y1 - 1999/6

N2 - Ln(Mg 1/2 Ti 1/2 )O3 (Ln = Dy, La, Nd, Pr, Sm, Y) compositions have been prepared, and their pertinent properties for use as thin film substrates for YBa2Cu3Ox (YBCO) were measured. X-ray diffraction shows that Ln(Mg 1/2 Ti 1/2 )O3 compositions have noncubic symmetry and the GdFeO3-type structure. Dielectric constant measurements revealed values between 22 and 27, which are larger than those of the LnAlO3 family. Quality factor (= 1/tan δ) of the ceramic specimens measured at room temperature was larger than 3000 at 10 GHz. Among the compounds, La(Mg 1/2 Ti 1/2 )O3 exhibited the highest dielectric constant and the lowest dielectric loss. Chemical reaction was observed between Ln(Mg 1/2 Ti 1/2 )O3 (Ln = Dy, Sm, Y) and YBCO after annealing a 1:1 mixture at 950°C. Considering dielectric and physical properties, La(Mg 1/2 Ti 1/2 )O3 and Sm(Mg 1/2 Ti 1/2 )O3 were determined to be suitable substrates for YBCO thin film used in microwave applications.

AB - Ln(Mg 1/2 Ti 1/2 )O3 (Ln = Dy, La, Nd, Pr, Sm, Y) compositions have been prepared, and their pertinent properties for use as thin film substrates for YBa2Cu3Ox (YBCO) were measured. X-ray diffraction shows that Ln(Mg 1/2 Ti 1/2 )O3 compositions have noncubic symmetry and the GdFeO3-type structure. Dielectric constant measurements revealed values between 22 and 27, which are larger than those of the LnAlO3 family. Quality factor (= 1/tan δ) of the ceramic specimens measured at room temperature was larger than 3000 at 10 GHz. Among the compounds, La(Mg 1/2 Ti 1/2 )O3 exhibited the highest dielectric constant and the lowest dielectric loss. Chemical reaction was observed between Ln(Mg 1/2 Ti 1/2 )O3 (Ln = Dy, Sm, Y) and YBCO after annealing a 1:1 mixture at 950°C. Considering dielectric and physical properties, La(Mg 1/2 Ti 1/2 )O3 and Sm(Mg 1/2 Ti 1/2 )O3 were determined to be suitable substrates for YBCO thin film used in microwave applications.

UR - http://www.scopus.com/inward/record.url?scp=0032647219&partnerID=8YFLogxK

U2 - 10.1557/JMR.1999.0333

DO - 10.1557/JMR.1999.0333

M3 - Article

AN - SCOPUS:0032647219

SN - 0884-2914

VL - 14

SP - 2484

EP - 2487

JO - Journal of Materials Research

JF - Journal of Materials Research

IS - 6

ER -

Dielectric properties of Ln(Mg_1/2Ti_1/2)O₃ as substrates for high-T_c superconductor thin films

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