Differential-to-common mode conversion noise suppression with unit cell EBG structure for bended differential lines

Sangyeol Oh; Beomsoo Shin; Jaehyuk Lim; Seungjin Lee; Jaehoon Lee

doi:10.1109/EDAPS.2016.7893137

Differential-to-common mode conversion noise suppression with unit cell EBG structure for bended differential lines

Sangyeol Oh, Beomsoo Shin, Jaehyuk Lim, Seungjin Lee, Jaehoon Lee

Department of Computer Science and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

Abstract

In order to reduce differential-to-common mode conversion noise in bended differential lines, we propose a unit cell electromagnetic bandgap (EBG) structure. The proposed structure compensates for mismatches of inductances and capacitances between inner and outer lines of the bended differential lines. Its performances of the common-mode noise suppression in frequency and time domains were verified by 3D full wave simulator, HFSS. Also, in order to verify the simulated results, the bended differential lines with the proposed unit cell EBG structure was fabricated and measured. As a result, suppression level of the differential-to-common mode conversion noise is below -20 dB from DC to 6 GHz, and Time-Domain-Through (TDT) common-mode noise voltage is reduced as compared with that of conventional bended differential lines.

Original language	English
Title of host publication	2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	103-105
Number of pages	3
ISBN (Electronic)	9781509061846
DOIs	https://doi.org/10.1109/EDAPS.2016.7893137
Publication status	Published - 2017 Apr 5
Event	2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016 - Honolulu, United States Duration: 2016 Dec 14 → 2016 Dec 16

Publication series

Name	2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016

Other

Other	2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016
Country/Territory	United States
City	Honolulu
Period	16/12/14 → 16/12/16

ASJC Scopus subject areas

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Modelling and Simulation

Access to Document

10.1109/EDAPS.2016.7893137

Cite this

Oh, S., Shin, B., Lim, J., Lee, S., & Lee, J. (2017). Differential-to-common mode conversion noise suppression with unit cell EBG structure for bended differential lines. In 2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016 (pp. 103-105). [7893137] (2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDAPS.2016.7893137

Differential-to-common mode conversion noise suppression with unit cell EBG structure for bended differential lines. / Oh, Sangyeol; Shin, Beomsoo; Lim, Jaehyuk et al.
2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016. Institute of Electrical and Electronics Engineers Inc., 2017. p. 103-105 7893137 (2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Oh, S, Shin, B, Lim, J, Lee, S & Lee, J 2017, Differential-to-common mode conversion noise suppression with unit cell EBG structure for bended differential lines. in 2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016., 7893137, 2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016, Institute of Electrical and Electronics Engineers Inc., pp. 103-105, 2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016, Honolulu, United States, 16/12/14. https://doi.org/10.1109/EDAPS.2016.7893137

Oh S, Shin B, Lim J, Lee S, Lee J. Differential-to-common mode conversion noise suppression with unit cell EBG structure for bended differential lines. In 2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016. Institute of Electrical and Electronics Engineers Inc. 2017. p. 103-105. 7893137. (2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016). doi: 10.1109/EDAPS.2016.7893137

Oh, Sangyeol ; Shin, Beomsoo ; Lim, Jaehyuk et al. / Differential-to-common mode conversion noise suppression with unit cell EBG structure for bended differential lines. 2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 103-105 (2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016).

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abstract = "In order to reduce differential-to-common mode conversion noise in bended differential lines, we propose a unit cell electromagnetic bandgap (EBG) structure. The proposed structure compensates for mismatches of inductances and capacitances between inner and outer lines of the bended differential lines. Its performances of the common-mode noise suppression in frequency and time domains were verified by 3D full wave simulator, HFSS. Also, in order to verify the simulated results, the bended differential lines with the proposed unit cell EBG structure was fabricated and measured. As a result, suppression level of the differential-to-common mode conversion noise is below -20 dB from DC to 6 GHz, and Time-Domain-Through (TDT) common-mode noise voltage is reduced as compared with that of conventional bended differential lines.",

author = "Sangyeol Oh and Beomsoo Shin and Jaehyuk Lim and Seungjin Lee and Jaehoon Lee",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE. Copyright: Copyright 2017 Elsevier B.V., All rights reserved.; 2016 IEEE Electrical Design of Advanced Packaging and Systems Symposium, EDAPS 2016 ; Conference date: 14-12-2016 Through 16-12-2016",

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N2 - In order to reduce differential-to-common mode conversion noise in bended differential lines, we propose a unit cell electromagnetic bandgap (EBG) structure. The proposed structure compensates for mismatches of inductances and capacitances between inner and outer lines of the bended differential lines. Its performances of the common-mode noise suppression in frequency and time domains were verified by 3D full wave simulator, HFSS. Also, in order to verify the simulated results, the bended differential lines with the proposed unit cell EBG structure was fabricated and measured. As a result, suppression level of the differential-to-common mode conversion noise is below -20 dB from DC to 6 GHz, and Time-Domain-Through (TDT) common-mode noise voltage is reduced as compared with that of conventional bended differential lines.

AB - In order to reduce differential-to-common mode conversion noise in bended differential lines, we propose a unit cell electromagnetic bandgap (EBG) structure. The proposed structure compensates for mismatches of inductances and capacitances between inner and outer lines of the bended differential lines. Its performances of the common-mode noise suppression in frequency and time domains were verified by 3D full wave simulator, HFSS. Also, in order to verify the simulated results, the bended differential lines with the proposed unit cell EBG structure was fabricated and measured. As a result, suppression level of the differential-to-common mode conversion noise is below -20 dB from DC to 6 GHz, and Time-Domain-Through (TDT) common-mode noise voltage is reduced as compared with that of conventional bended differential lines.

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Differential-to-common mode conversion noise suppression with unit cell EBG structure for bended differential lines

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