Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry

Kiho Bae; Dong Young Jang; Joong Sun Park; Ji Won Son; Fritz B. Prinz; Joon Hyung Shim

doi:10.1007/s40684-019-00169-3

Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry

Kiho Bae, Dong Young Jang, Joong Sun Park, Ji Won Son, Fritz B. Prinz, Joon Hyung Shim

Research output: Contribution to journal › Article › peer-review

Abstract

Diffusion of oxide ions along heterostructured yttria-stabilized zirconia (YSZ) epitaxially grown on single crystalline MgO (001) is investigated. Pulsed laser deposition is used for the epitaxial growth and focused ion beam was applied to open the lateral surface of the YSZ-MgO interface layers and to enable incorporation and diffusion of oxygen. The sample is annealed in ¹⁸O₂ environment to trace oxide ion transport with Al₂O₃ layers atop to block diffusion perpendicular to surface of the YSZ plane. Time-of-flight secondary mass ion spectrometry (TOF–SIMS) analyze the planar diffusion profiles. Diffusivity and surface exchange rate are estimated by SIMS data fitting. As a result, it is identified that both oxide ion diffusion and surface incorporation rates are significantly enhanced on surface of the heterostructured YSZ on MgO (001) compared to bulk YSZ.

Original language	English
Pages (from-to)	405-410
Number of pages	6
Journal	International Journal of Precision Engineering and Manufacturing - Green Technology
Volume	7
Issue number	2
DOIs	https://doi.org/10.1007/s40684-019-00169-3
Publication status	Published - 2020 Mar 1

Bibliographical note

Publisher Copyright:
© 2019, Korean Society for Precision Engineering.

Keywords

Heterostructure
Ion diffusion
Isotope tracer
Stain effect
Surface exchange
Yttria-stabilized zirconia

ASJC Scopus subject areas

Renewable Energy, Sustainability and the Environment
General Materials Science
Mechanical Engineering
Industrial and Manufacturing Engineering
Management of Technology and Innovation

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1007/s40684-019-00169-3

Cite this

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title = "Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry",

abstract = "Diffusion of oxide ions along heterostructured yttria-stabilized zirconia (YSZ) epitaxially grown on single crystalline MgO (001) is investigated. Pulsed laser deposition is used for the epitaxial growth and focused ion beam was applied to open the lateral surface of the YSZ-MgO interface layers and to enable incorporation and diffusion of oxygen. The sample is annealed in 18O2 environment to trace oxide ion transport with Al2O3 layers atop to block diffusion perpendicular to surface of the YSZ plane. Time-of-flight secondary mass ion spectrometry (TOF–SIMS) analyze the planar diffusion profiles. Diffusivity and surface exchange rate are estimated by SIMS data fitting. As a result, it is identified that both oxide ion diffusion and surface incorporation rates are significantly enhanced on surface of the heterostructured YSZ on MgO (001) compared to bulk YSZ.",

keywords = "Heterostructure, Ion diffusion, Isotope tracer, Stain effect, Surface exchange, Yttria-stabilized zirconia",

author = "Kiho Bae and Jang, {Dong Young} and Park, {Joong Sun} and Son, {Ji Won} and Prinz, {Fritz B.} and Shim, {Joon Hyung}",

note = "Publisher Copyright: {\textcopyright} 2019, Korean Society for Precision Engineering.",

year = "2020",

month = mar,

day = "1",

doi = "10.1007/s40684-019-00169-3",

language = "English",

volume = "7",

pages = "405--410",

journal = "International Journal of Precision Engineering and Manufacturing - Green Technology",

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publisher = "Springer Science + Business Media",

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TY - JOUR

T1 - Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry

AU - Bae, Kiho

AU - Jang, Dong Young

AU - Park, Joong Sun

AU - Son, Ji Won

AU - Prinz, Fritz B.

AU - Shim, Joon Hyung

PY - 2020/3/1

Y1 - 2020/3/1

N2 - Diffusion of oxide ions along heterostructured yttria-stabilized zirconia (YSZ) epitaxially grown on single crystalline MgO (001) is investigated. Pulsed laser deposition is used for the epitaxial growth and focused ion beam was applied to open the lateral surface of the YSZ-MgO interface layers and to enable incorporation and diffusion of oxygen. The sample is annealed in 18O2 environment to trace oxide ion transport with Al2O3 layers atop to block diffusion perpendicular to surface of the YSZ plane. Time-of-flight secondary mass ion spectrometry (TOF–SIMS) analyze the planar diffusion profiles. Diffusivity and surface exchange rate are estimated by SIMS data fitting. As a result, it is identified that both oxide ion diffusion and surface incorporation rates are significantly enhanced on surface of the heterostructured YSZ on MgO (001) compared to bulk YSZ.

AB - Diffusion of oxide ions along heterostructured yttria-stabilized zirconia (YSZ) epitaxially grown on single crystalline MgO (001) is investigated. Pulsed laser deposition is used for the epitaxial growth and focused ion beam was applied to open the lateral surface of the YSZ-MgO interface layers and to enable incorporation and diffusion of oxygen. The sample is annealed in 18O2 environment to trace oxide ion transport with Al2O3 layers atop to block diffusion perpendicular to surface of the YSZ plane. Time-of-flight secondary mass ion spectrometry (TOF–SIMS) analyze the planar diffusion profiles. Diffusivity and surface exchange rate are estimated by SIMS data fitting. As a result, it is identified that both oxide ion diffusion and surface incorporation rates are significantly enhanced on surface of the heterostructured YSZ on MgO (001) compared to bulk YSZ.

KW - Heterostructure

KW - Ion diffusion

KW - Isotope tracer

KW - Stain effect

KW - Surface exchange

KW - Yttria-stabilized zirconia

UR - http://www.scopus.com/inward/record.url?scp=85075795266&partnerID=8YFLogxK

U2 - 10.1007/s40684-019-00169-3

DO - 10.1007/s40684-019-00169-3

M3 - Article

AN - SCOPUS:85075795266

SN - 2288-6206

VL - 7

SP - 405

EP - 410

JO - International Journal of Precision Engineering and Manufacturing - Green Technology

JF - International Journal of Precision Engineering and Manufacturing - Green Technology

IS - 2

ER -

Direct Measurement of Ion Diffusivity in Oxide Thin Film by Using Isotope Tracers and Secondary Ion Mass Spectrometry

Abstract

Bibliographical note

Keywords

ASJC Scopus subject areas

UN SDGs

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