Direct observation of localized defect states in semiconductor nanotube junctions

Hajin Kim, J. Lee, S. J. Kahng, Y. W. Son, S. B. Lee, C. K. Lee, J. Ihm, Young Kuk

    Research output: Contribution to journalArticlepeer-review

    102 Citations (Scopus)

    Abstract

    Scanning tunneling microscopy of semiconductor-semiconductor carbon nanotube junctions with different band gaps was studied. Characteristic features of the wave functions at different energy levels were exhibited in the atomically resolved scanning tunneling microscopy. The experimental observations in terms of the pentagon-heptagon defects in the junction were interpreted.

    Original languageEnglish
    Article number216107
    Pages (from-to)2161071-2161074
    Number of pages4
    JournalPhysical review letters
    Volume90
    Issue number21
    Publication statusPublished - 2003 May 30

    ASJC Scopus subject areas

    • General Physics and Astronomy

    Fingerprint

    Dive into the research topics of 'Direct observation of localized defect states in semiconductor nanotube junctions'. Together they form a unique fingerprint.

    Cite this