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Dopant profile model in a shallow germanium n
+
/p junction
Jung Woo Baek
, Jaewoo Shim
, Jin Hong Park
*
, Woo Shik Jung
,
Hyun Yong Yu
*
Corresponding author for this work
Research output
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peer-review
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+
/p junction'. Together they form a unique fingerprint.
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Keyphrases
P-n Junction
100%
Germanium
100%
Dopant Profile
100%
Profile Model
100%
Diffusivity
40%
Fitting Algorithm
40%
N-type Dopant
40%
Backscatter
20%
Dopant
20%
Distribution-based
20%
Annealing Temperature
20%
Challenging Issues
20%
Peak Position
20%
Least Square Method
20%
Scattering Processes
20%
Shallow Junction
20%
Diffusion Theory
20%
Profile Data
20%
Gaussian Distribution
20%
Fast Diffusion
20%
Position Value
20%
Asymmetric Diffusion
20%
Diffusivity Equation
20%
Material Science
Doping (Additives)
100%
Germanium
100%
Diffusivity
42%
Annealing
14%
Surface (Surface Science)
14%
Engineering
Dopants
100%
Diffusivity
28%
Least Square
14%
Annealing Temperature
14%
Back Surface
14%
Gaussians
14%
Diffusion Theory
14%
Square Method
14%
Shallow Junction
14%
Data Profile
14%
Scattering Phenomenon
14%
Diffusivity Equation
14%