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EBIC investigations of defect distribution in ELOG GaN films
E. B. Yakimov, P. S. Vergeles, A. V. Govorkov, A. Y. Polyakov, N. B. Smirnov, In Hwan Lee, Cheul Ro Lee, S. J. Pearton
Research output: Contribution to journal › Article › peer-review
5
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(Scopus)