EBIC investigations of defect distribution in ELOG GaN films
- E. B. Yakimov*
- , P. S. Vergeles
- , A. V. Govorkov
- , A. Y. Polyakov
- , N. B. Smirnov
- , In Hwan Lee
- , Cheul Ro Lee
- , S. J. Pearton
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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