Abstract
The effect of collector lateral scaling on the performance of 300GHz-level SiGe HBTs is investigated. Peak fT and fmax exhibited an initial improvement followed by a degradation with decreasing collector width. Possible causes behind the observed trend are discussed in terms of RC delay and the Kirk effect.
Original language | English |
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Pages (from-to) | 1180-1181 |
Number of pages | 2 |
Journal | Electronics Letters |
Volume | 42 |
Issue number | 20 |
DOIs | |
Publication status | Published - 2006 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering