Effect of contact geometry on 4H-SiC rectifiers with junction termination extension
- S. Nigam
- , J. Kim
- , B. Luo
- , F. Ren*
- , G. Y. Chung
- , S. J. Pearton
- , J. R. Williams
- , K. Shenai
- , P. Neudeck
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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