Abstract
Crystalline pyrochlore Bi 2 Ti 2 O 7 (B 2 T 2 ) thin films were well formed at 300 °C under 740 mTorr of oxygen partial pressure using pulsed laser deposition. In order to improve the electrical properties of the dielectric B 2 T 2 films, Mn ions were doped into the films and their influence was investigated. Improvement in electrical behavior, especially leakage current density were revealed via impedance spectroscopy and electrochemical studies. Mn doping at an appropriate level improved the electrical properties of the films by affording extrinsic oxygen vacancies that reduced the number of intrinsic oxygen vacancies acting as electron trap sites at the interface between the Pt electrode and the B 2 T 2 film. Schottky emission was posited as the leakage current mechanism in the 10 mol% Mn doped B 2 T 2 (Mn:B 2 T 2 ) films. The barrier height between the Pt electrode and the Mn:B 2 T 2 film was approximately 1.46 eV, but decreased to 0.51 eV for the non-doped film due to large numbers of intrinsic oxygen vacancies.
Original language | English |
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Pages (from-to) | 75-79 |
Number of pages | 5 |
Journal | Applied Surface Science |
Volume | 415 |
DOIs | |
Publication status | Published - 2017 Sept 1 |
Bibliographical note
Publisher Copyright:© 2016 Elsevier B.V.
Keywords
- Bi Ti O
- Leakage current mechanism
- Metal-insulator-metal capacitor
- Pyrochlore
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Surfaces and Interfaces