Skip to main navigation Skip to search Skip to main content

Effect of grain size on the electrical failure of copper contacts in fretting motion

  • H. J. Noh
  • , J. W. Kim
  • , S. M. Lee
  • , H. Jang*
  • *Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    Fingerprint

    Dive into the research topics of 'Effect of grain size on the electrical failure of copper contacts in fretting motion'. Together they form a unique fingerprint.
    Sort by

    Keyphrases

    Material Science