Effect of proton irradiation on DC performance and reliability of circular-shaped AlGaN/GaN high electron mobility transistors

Y. Y. Xi, Y. H. Hwang, Y. L. Hsieh, S. Li, F. Ren, S. J. Pearton, E. Patrick, M. E. Law, G. Yang, H. Y. Kim, J. Kim, A. G. Baca, A. A. Allerman, C. Sanchez

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Engineering & Materials Science