Abstract
We report spatially resolved Raman scattering from Si-doped epitaxial laterally overgrown GaN structures to investigate spatial variations in stress and free electron concentration. The doping-induced increase in the free electron concentration is relatively higher in the laterally overgrown regions than in the coherently grown regions due to the increased contribution of the high-energy A 1 longitudinal optical phonon-plasmon coupled mode. In addition, the E 2(high) [E 2(low)] phonon energy shifts downward (upward) more significantly in the laterally overgrown regions than in the coherently grown regions. The doping-induced Raman shifts of the E 2(high) and E 2(low) phonons in the laterally overgrown regions are approximately -0.6 and 0.11 cm -1, respectively, corresponding to the in-plane stress of ∼0.22 GPa.
Original language | English |
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Pages (from-to) | 267-270 |
Number of pages | 4 |
Journal | Current Applied Physics |
Volume | 13 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2013 Jan |
Externally published | Yes |
Keywords
- GaN
- Optical phonons
- Raman scattering
ASJC Scopus subject areas
- Materials Science(all)
- Physics and Astronomy(all)