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Effective Schottky barrier height and interface trap density reduction engineering using 2-dimensional reduced graphene oxide interlayer for metal-interlayer-semiconductor contact structure

  • Sungjoo Song
  • , Seung Hwan Kim
  • , Seung Geun Kim
  • , Kyu Hyun Han
  • , Hyung jun Kim
  • , Hyun Yong Yu*
    • *Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    15   Link opens in a new tab Citations (Scopus)

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    Material Science