Effective Schottky barrier height and interface trap density reduction engineering using 2-dimensional reduced graphene oxide interlayer for metal-interlayer-semiconductor contact structure
Sungjoo Song, Seung Hwan Kim, Seung Geun Kim, Kyu Hyun Han, Hyung jun Kim, Hyun Yong Yu*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
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