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Effective temperature measurements of AlGaN/GaN-based HEMT under various load lines using micro-Raman technique
Jihyun Kim, J. A. Freitas, J. Mittereder, R. Fitch, B. S. Kang, S. J. Pearton, F. Ren
Research output: Contribution to journal › Article › peer-review
32
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(Scopus)