Effective temperature measurements of AlGaN/GaN-based HEMT under various load lines using micro-Raman technique

  • Jihyun Kim*
  • , J. A. Freitas
  • , J. Mittereder
  • , R. Fitch
  • , B. S. Kang
  • , S. J. Pearton
  • , F. Ren
    • *Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

    32 Citations (Scopus)

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    Engineering