Effects of plasma enhanced chemical vapor deposition radio frequency on the properties of SiNx:H films

Kyung Dong Lee, Kwang Sun Ji, Soohyun Bae, Seongtak Kim, Hyunho Kim, Jae Eun Kim, Yoon Chung Nam, Sungjin Choi, Myeong Sang Jeong, Min Gu Kang, Hee Eun Song, Yoonmook Kang, Hae Seok Lee, Donghwan Kim

    Research output: Contribution to journalArticlepeer-review

    Abstract

    Hydrogenated silicon nitride (SiNx:H) films were fabricated using plasma-enhanced chemical vapor deposition at high (13.56 MHz), low (400 kHz), and dual (13.56 MHz+400 kHz) radio frequencies. The antireflection and passivation qualities of each film were investigated before their application as the front surface layer of crystalline silicon solar cells. The use of a high radio frequency was observed to have a positive effect on the cell performance, which increased by 0.4% in comparison with the minimum value obtained for a 156 mm x 156 mm cell.

    Original languageEnglish
    Pages (from-to)4687-4693
    Number of pages7
    JournalJournal of Nanoscience and Nanotechnology
    Volume17
    Issue number7
    DOIs
    Publication statusPublished - 2017

    Bibliographical note

    Publisher Copyright:
    Copyright © 2017 American Scientific Publishers. All rights reserved.

    Keywords

    • Passivation
    • Plasma-enhanced chemical vapor deposition frequency
    • Silicon nitride
    • Silicon solar cell
    • Surface damage

    ASJC Scopus subject areas

    • Bioengineering
    • General Chemistry
    • Biomedical Engineering
    • General Materials Science
    • Condensed Matter Physics

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